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This Recommendation specifies techniques for the derivation of additional keying material from a secret key—either established through a key-establishment...
This document, SP250-99 (2022), NIST Measurement Services: Diffuse Visual Transmission Density, describes the instrument used to measure diffuse visual...
Nancy Lin, Stephanie Servetas, Scott Jackson, Katrice Lippa, Kirsten Parratt, Philip Mattson, Clare Beahn, Mia Mattioli, Sally Gutierrez, Michael Focazio, Ted Smith, Paul Storella, Sarah Wright
Wastewater surveillance is a promising approach to monitor biological and chemical contaminants on a community level in support of public health and safety...
Richard S. Gates, William Alexander Osborn, Mark McLean, Gordon A. Shaw, James J. Filliben
A batch of 94 silicon chips containing arrays of uniform rectangular cantilevers were microfabricated from a single silicon wafer and their stiffnesses and...
Kathryn Butler, Erik L. Johnsson, Alexander Maranghides, Shonali Nazare, Marco G. Fernandez, Rachel McIntyre, William Saar, Mariusz Zarzecki, Wei Tang, Eric Auth, Michael Pryor, Colin McLaughlin
A series of field experiments was conducted to examine the effects on fire spread toward a structure for combustible fences and mulch under conditions that may...
This report documents a series of fire experiments performed within steel electrical enclosures. The objective is to validate a simple empirical model that...
This document describes potential use-cases for data interoperability in election technology components not previously considered in past efforts. Such...
There is currently no common data format for ballot styles and associated use-cases. This white paper investigates this and other potential interoperability...
Anita Balachandra, David Gundlach, Paul D. Hale, Kevin K. Jurrens, R Joseph Kline, Tim McBride, Ndubuisi George Orji, Sanjay (Jay) Rekhi, Sivaraj Shyam-Sunder, David G. Seiler
Semiconductors are critical to our Nation's economic growth, national security, and public health and safety. Revolutionary advances in microelectronics...
Jake Benzing, Nicholas Derimow, Enrico Lucon, Dash Weeks
In the framework of a collaborative project between ASME, NASA, and NIST, quasi-static fracture toughness tests have been performed at liquid nitrogen...
This report is a part of a series of studies on the topic of face morphing, its relevance and implications as a vulnerability to automated face recognition, and...
Chuck Barber, Colleen E. Bryan Sallee, Monique Johnson, Shaun Kotoski, Rick L. Paul, Nicholas Sharp, Maria Isabel Vega Martinez, James H. Yen, Lee L. Yu, Laura Wood, John Sieber, Stephen Long
The National Institute of Standards and Technology (NIST) recently released SRM 1568c Rice Flour which has value assignments for over 30 analytes, including...
Gema Howell, Kevin Gerard Brady, Don Harriss, Scott Ledgerwood
Public safety officials utilizing the forthcoming public safety broadband networks will have access to devices, such as mobile devices, tablets and wearables...
Based on the collaborative framework established between ASME, NASA, and NIST, quasi-static tensile tests were performed in liquid nitrogen (77 K) and liquid...
John Daugman correctly summarized the state of forensic iris recognition circa 2006 for the book Forensic Human Identification: an Introduction [1]: Iris...
The purpose of this report is to document additional simulations that staff of the U.S. National Institute of Standards and Technology (NIST) performed, at the...
With an artificial example of a 2D nonlinear advection diffusion equation on the unit square this paper considers the data assimilation problem of finding...
Gorjan Alagic, David Cooper, Quynh Dang, Thinh Dang, John M. Kelsey, Jacob Lichtinger, Yi-Kai Liu, Carl A. Miller, Dustin Moody, Rene Peralta, Ray Perlner, Angela Robinson, Daniel Smith-Tone, Daniel Apon
The National Institute of Standards and Technology is in the process of selecting public-key cryptographic algorithms through a public, competition-like process...
David L. Duewer, Jeanice Brown Thomas, Stephen Young
From 1984 to 2017, the National Institute of Standards and Technology (NIST) Micronutrients Measurement Quality Assurance Program (MMQAP) coordinated a series...
Lingnan Lin, Marylia Duarte Batista, Natascha S. Milesi-Ferretti
This report presents a state-of-the-art review of the measurement of pressure loss of pipe fittings. The mechanisms of pressure loss in pipes and fittings are...
Shelby Bowers, Yvonne Branden, Tina G. Butcher, Richard A. Harshman, Gloria Diane Lee, David Sefcik, Lisa Warfield
The 105th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held virtually July 12 - 16, 2020. The 106th Annual Meeting of the...
A new Helmholtz energy equation of state is presented for trans-1-chloro-3,3,3-trifluoroprop-1-ene [R1233zd(E)], which is expressed with temperature and density...
This document provides a new Incident Handling framework dedicated to Operational Technology. This framework expands the traditional technical steps by giving...
David A. Wollman, Edward Griffor, Chris Greer, Michael Dunaway, Martin Serrano, Martin Burns, Sokwoo Rhee
This publication presents research findings and scientific work that advance the development and progression of smart city and community measurement methodology...
NIST has developed a user-friendly spreadsheet-based software package for the Master Curve analysis of fracture toughness tests performed in the ductile-to...
Fault detection often depends on the specific order of inputs that establish states which eventually lead to a failure. However, beyond basic structural...
John M. Libert, Shahram Orandi, Bruce Bandini, Kenneth Ko, Craig I. Watson, Christopher Stafford, Matthew E. Staymates, John Grantham
This guidance specifies a protocol and associated metrics for the evaluation of contactless fingerprint acquisition device, and their interoperability with...
NIST provides certified reference Charpy specimens to companies and laboratories around the world for the indirect verification of impact machines in accordance...
The SRM 114 series for portland cement fineness has been provided by NIST since 1934 for use in calibrating instruments for measuring fineness characteristics...