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NIST Pubs

Missing Data Methods and Toolbox Users Guide

Author(s)
Curtis H. Parks, Gerard N. Stenbakken, Alexei Nikolaev
Measurement data are collected to characterize a production run of devices that can then be analyzed to identify a reduced set of measurement points. Such

Picture Password: A Visual Login Technique for Mobile Devices

Author(s)
Wayne Jansen, Serban I. Gavrila, Vladimir Korolev, Richard P. Ayers, Ryan Swanstrom
Adequate user authentication is a persistent problem, particularly with handheld devices, which tend to be highly personal and at the fringes of an organization

Semiconductor Microelectronics and Nanoelectronics Programs

Author(s)
Stephen Knight, Joaquin (. Martinez, Michele L. Buckley
The microelectronics industry supplies vital components to the electronics industry and to the U.S. economy, enabling rapid imporvements in productivity and in

Tolerance Synthesis Scheme

Author(s)
Utpal Roy, N Pramanik, Sudarsan Rachuri, Ram D. Sriram, Kevin W. Lyons
The objective of this report is to identify representations and issues for the generic assembly information model and its use in a proactive tolerance synthesis

A Survey of Design ? Analysis Integration Issues

Author(s)
Greg Mocko, Steven J. Fenves
The report constitutes a survey of work directed towards the emergence of next-generation product development tools, specifically in the area of design-analysis

NIST Research Library Benchmark Study, 2001: Summary Report

Author(s)
P J. Deutsch, Diane Cunningham, L A. Greenhouse, Susan L. Makar, W F. Overman, Susan A. Sanders, Barbara P. Silcox
In 2002, the NIST Research Library of the Information Services Division, Technology Services, benchmarked itself against other science and technology libraries

BFRL Publications, 2002

Author(s)
Star R. Burgess, Kathleen C. Whisner, Glenn P. Forney, Paul A. Reneke
Welcome to BFRL Publications, 2002. These two CD-ROMs contain publications produced by BFRL staff, publications resulting from contracts or grants with BFRL and
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