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Joseph W Magee, Thomas J Bruno, Daniel G Friend, Marcia L Huber, Arno Laesecke, Eric W Lemmon, Mark O McLinden, Richard A Perkins, Jörg Baranski, Jason A Widegren
Joshua Lubell, Eswaran Subrahmanian, William Regli, Sudarsan Rachuri
This report summarizes the presentations, discussions and recommendations of a workshop held at the National Institute of Standards and Technology on March 15...
Several sources of guidance, policies, standards and legislative acts provide many requirements for the federal agencies when protecting entrusted information...
The purpose of this report is to identify and illustrate an approach to simplify and strengthen capital planning for information system security in compliance...
The popularity of lightweight, metal plate connected wood truss construction is increasing due to cost effectiveness, versatility, and ease of construction...
Rebecca S. Pugh, Michael B. Ellisor, Amanda J. Moors, Barbara J. Porter, Paul R. Becker
The National Biomonitoring Specimen Bank (NBSB) was established in 1979 from the pilot Environmental Specimen Bank Program and is maintained at the National...
Ben N. Davis, Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, James R. Baker-Jarvis, Michael D. Janezic
Building materials are often incorporated into complex, multi-layer macrostructures that are simply not amenable to measurements using coax or waveguide sample...
While most dimensional metrologists know that the reference temperature for dimensional measurements is 20 C, very few know how or why that temperature was...
The Office of Law Enforcement Standards (OLES) at the National Institute of Standards and Technology (NIST)helps law enforcement and criminal justice agencies...
Herbert S. Bennett, Alain C. Diebold, C. M. Garner
We present an assessment of the state of the nation''s measurement system in its ability to meet the metrology needs of the semiconductor industry. Lacking an...
The NIST Optoelectronics Division provides measurement technology, standards, and traceability for the optoelectronics industry. This document describes the...
This program is a minor revision of the NIST Database "NIST Thermophysical Properties of Hydrocarbon Mixtures Database (Supertrapp)" that corrects some known...
Geoffrey B. McFadden, Sam R. Coriell, Katharine F. Gurski, David Cotrell
We perform linear stability calculations for horizontal fluid bilayers, taking into account both buoyancy effects and thermocapillary effects in the presence of...
The Workshop on Reliability Issues in Nanomaterials was held at the Boulder Laboratories of the U. S. Department of Commerce on August 17-19, 2004. It was...
Michael T. Stocker, Richard M. Silver, Ravikiran Attota, Jay S. Jun
This document describes the physical characteristics of Standard Reference Material SRM 5000, provides guidance for its use in calibrating overlay (OL) tools...
The Electromagnetics Division is a critical national resource for a wide range of customers. U.S. industry is the primary customer both for the division's...
James F. Dray Jr., April Giles, Michael Kelley, Ramaswamy Chandramouli
The purpose of this document is to present recommendations for Personal Identity Verification (PIV) card readers in the area of performance and communications...