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Journals

Establishing a Worldwide Unified Rockwell Hardness Scale With Metrology Traceability

January 1, 1997

Author(s)

Jun-Feng Song, Samuel Low, David J. Pitchure, A Germak, S Desogus, T Polzin, H Yang, H Ishida, G Barbato

Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. It is now possible

Industrial Uses of STM and AFM

January 1, 1997

Author(s)

Theodore V. Vorburger, John A. Dagata, G. Wilkening, K Iizuka

We review the field of STM and AFM as applied to industrial problems, and we classify the applications into four classes: research with potential benefit to

Hybrid Optical-Electrical Overlay Test Structure

January 1, 1997

Author(s)

Michael W. Cresswell, Robert Allen, L Linholm, William F. Guthrie, William B. Penzes, A Gurnell

This paper describes the exploratory use of electrical test structures to enable the calibration of optical overlay instruments of the type used to monitor

Finish Hard Turning of Powder Metallurgy M50 Steel

January 1, 1997

Author(s)

Y K. Chou, Christopher J. Evans

Finishing performance in turning of hardened powder metallurgy (PM) AISI M50 steel using cubic boron nitride (CBN) tools has been studied. Tool wear and flank

White Layers and Thermal Modeling of Hard Turned Surfaces

January 1, 1997

Author(s)

Y K. Chou, Christopher J. Evans

White layers in hard turned surfaces are identified, characterized and measured as a function of tool flank wear and cutting speed. White layer depth generally

Distributions of Measurement Errors for Single-Axis Magnetic Field Meters During Measurements Near Appliances

January 1, 1997

Author(s)

Martin Misakian, Charles D. Fenimore

Characterization of Fiber-Waviness in Composite Specimens Using Deep Line-Focus Acoustic Microscopy

January 1, 1997

Author(s)

W Sachse, D Xiang, Nelson N. Hsu, K Y. Kim

A broadband lensless, line-focus transducer possessing a large aperture and low f-number can be used to generate leaky surface waves in a specimen. It is a

Statistical Error Analysis of Time and Polarization Resolved Ultrasonic Measurements

January 1, 1997

Author(s)

D Xiang, Gerald V. Blessing, Nelson N. Hsu

The time and polarization resolved ultrasonic technique which we previously developed has been demon-strated to simultaneously provide measurements of the wave

Spatial Resolution with Time-and-Polarization-Resolved Acoustic Microscopy

January 1, 1997

Author(s)

D Xiang, Gerald V. Blessing, Nelson N. Hsu

We have developed a time-and-polarization-resolved acoustic microscopy technique to determine material properties of solids immersed in water. At the heart of

Local Characterization of Transmission Properties of a Two-Dimensional Photonic Crystal

January 1, 1997

Author(s)

E B. Mcdaniel, Julia W. Hsu, Lori S. Goldner, R J. Tonucci, Eric L. Shirley, Garnett W. Bryant

Optically Isolated Current to Voltage Converter in an Electron Optics System

January 1, 1997

Author(s)

Alan H. Band, John Unguris

A simple, inexpensive, optically isolated current-to-voltage converter circuit has been developed for the measurement of bipolar currents in the range of 10 pA

Local-density-functional calculations of the Energy of Atoms

January 1, 1997

Author(s)

Svetlana A. Kotochigova, Zachary H. Levine, Eric L. Shirley, Mark D. Stiles, Charles W. Clark

The total energies of atoms and with atomic number Ζ from 1 to 92 and singly-charge cations with Ζ from 2 to 92 have been calculated to an accuracy of 1

Observations of Alloying in the Growth of Cr on Fe(001)

January 1, 1997

Author(s)

Angela Davies, Joseph A. Stroscio, Daniel T. Pierce, John Unguris, Robert Celotta

Using scanning tunneling microscopy, we observe the alloying of Cr with an Fe(001) substrate for various coverages at two temperatures. At low Cr coverage, the