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Journals

The NIST Display Interface Testbed: The Development of a Centrally Controlled Testing System for the Automated Generation of Stimuli and Control Feedback

January 12, 1999

Author(s)

John W. Roberts, J A. Ward

Impressive advances are being made in the field of display metrology, as illustrated in standards such as the Video Electronics Standards Association's Flat

Electronic Structure and Spectra of Oxovanadium Silicate

January 11, 1999

Author(s)

Morris Krauss

The electronic structure and spectroscopy of the oxovanadium catalytic center on a silica surface is modeled with the molecule OV(OSIH 3)3. Excited electronic

Standards for the rapid prototyping industry

January 4, 1999

Author(s)

Kevin K. Jurrens

This paper proposes that development of formalized standards for the rapid prototyping (RP) industry will help enable the continued growth and further

Manufacturer's CORBA Interface Testing Toolkit: Overview

January 1, 1999

Author(s)

David W. Flater

The Manufacturer's CORBA Interface Testing Toolkit (MCITT)is a software package that supports testing of CORBA components and interfaces. It simplifies the

Noise averaging and measurement resolution (or a "little noise is a good thing")

January 1, 1999

Author(s)

James E. Potzick

When a continuous quantity is measured with a digital instrument or digitized for further processing, a measurement uncertainty component is incurred from

Radiationless Resonant Raman Scattering at the Ar K Edge

January 1, 1999

Author(s)

Thomas W. LeBrun, S H. Southworth, G B. Armen, M A. MacDonald, Y Azuma

Partial cross sections for Ar K-LZL3(1 D2)np, n=4 and 5 spectator Auger states excited by x-ray absorption across the K-edge were measured and compared with

Algorithms for Calculating Single-Atom Step Heights

January 1, 1999

Author(s)

Joseph Fu, V W. Tsai, R Koning, Ronald G. Dixson, Theodore V. Vorburger

Recently, measuring Si(111) single atomic steps prompted us to investigate the measuring technique. The section technique is the most popular method for

AlInP benchmarks for growth of AlGaInP compounds by organometallic vapor-phase epitaxy

January 1, 1999

Author(s)

Kristine A. Bertness, S. R. Kurtz, S. E. Asher, R. C. Reedy

We have demonstrated that source material and growth system purity can be successfully evaluated by characterizing AllnP samples grown by organometallic vapor

Keeping Analytical Tools in Line with NTRS Goals: An Industry Challenge

January 1, 1999

Author(s)

Thomas J. Shaffner

As we enter the gigabit dynamic random access memory (DRAM) era, stringent demands for higher performance materials characterization are prematurely pushing

Viewpoint: Roadmaps for Compound Semiconductors: Knowledge-based Investments for Next Century

January 1, 1999

Author(s)

Herbert S. Bennett

Imagine a world without desk-top laser printers or laser fax machines, without cellular telephones or pagers or global positioning, without compact disk (CD)

Evaluation of Variance in Zeta Potential Measurements

January 1, 1999

Author(s)

M Chapman-Wilbert, S Delagah, J J. Pellegrino

We evaluated sources of varience in the measurement of the surface zeta potential of flat sheet specimens of cellulose di/triacetate membranes with a commercial

On the International Temperature Scale of 1990 (ITS-90), Part II: Recommended Techniques for Comparisons, at the Highest Level of Accuracy, of Fixed-Point Cells Used for Contact Thermometry

January 1, 1999

Author(s)

Billy W. Mangum, P Bloembergen, M V. Chattle, B Fellmuth, P Marcarino, A I. Pokhodun

Techniques are recommended for comparisons, at the highest levels of accuracy, of fixed-point cells of the defining fixed points, excluding the vapour-pressure

Brief review of primary methods applicable to key comparisons in acoustics

January 1, 1999

Author(s)

Victor Nedzelnitsky

Historically, various techniques have been used in acoustics to attempt to establish and measure sound pressures (spatially uniform amplitude of sound pressure

Structured, textured or engineered surfaces

January 1, 1999

Author(s)

Christopher J. Evans, James B. Bryan

Fine scale periodic structures offer designers additional freedom to create novel functions or combinations of functions. This emerging field of structured

Modified Field Studies for CSCW Systems

January 1, 1999

Author(s)

Michelle P. Steves, Jean C. Scholtz

We, at the National Institute of Standards and Technology (NIST), are in the process of instituting and assessing collaboration technologies for manufacturing

Impact of Variable Pulse Pressure and Nonlinear Propagation on Industrial Ultrasonic NDE Measurement Interpretation and Uncertainty

January 1, 1999

Author(s)

John A. Slotwinski

Nominally identical ceramic-element ultrasonic transducers of the type used in the aerospace and metals industries for nondestructive evaluation (NDE) often

Ultrasonic Measurement of the Dynamic Elastic Moduli of Small Metal Samples

January 1, 1999

Author(s)

John A. Slotwinski, Gerald V. Blessing

Ultrasonic velocity measurements were used to determine the dynamic elastic moduli small metal samples to a 2[sigma] measurement uncertainty of less than one

Review of Primary Methods Applicable to Key Comparisons in Acoustics

January 1, 1999

Author(s)

Victor Nedzelnitsky

Historically, various techniques have been used in acoustics to attempt to establish and to measure sound pressures in the pressure field (spatially uniform

The Influence of Elastomer Concentration on Toughness in Dispersions Containing Preformed Acrylic Elastomeric Particles in an Epoxy Matrix

January 1, 1999

Author(s)

J He, D T. Raghavan, D Hoffman, Donald L. Hunston

High Speed Grinding of Silicon Nitride with Electroplated Diamond Wheels, II. Wheel Topography and Grinding Mechanisms

January 1, 1999

Author(s)

T W. Hwang, S Malkin, Christopher J. Evans

This is the second in a series of two papers concerned with high speed grinding of silicon nitride with electroplated diamond wheels. In a companion paper, it

Acoustic Emission Monitoring of High Speed Grinding of Silicon Nitride

January 1, 1999

Author(s)

T W. Hwang, Eric P. Whitenton, Nelson N. Hsu, Gerald V. Blessing, Christopher J. Evans

Acoustic emission monitoring of a machining process offers real-time sensory input which could provide tool condition and part quality information that is

Characterization of Ternary Compounds in the BaO:Fe₂O₃:TiO₂ System: Ba₆Fe₄₅Ti₁₇O₁₀₆ and BaFe₁₁Ti₃O₂₃

January 1, 1999

Author(s)

Terrell A. Vanderah, Winnie K. Wong-Ng, B H. Toby, V. M. Browning, Robert D. Shull, Richard G. Geyer, Robert S. Roth

Single crystals of Ba 6Fe 45Ti 17O 106 and BaFe 11Ti 3O 23 were obtained as major and minor co-products, respectively, by slow-cooling an off-stoichiometric BaO

Mechanical and Swelling Behaviors of Rubber: a Comparison of Some Molecular Models With Experiment

January 1, 1999

Author(s)

W H. Han, F Horkay, G B. McKenna

A Constrained Monte Carlo Simulation Method for the Calculation of CMM Measurement Uncertainty

January 1, 1999

Author(s)

Steven D. Phillips, Bruce R. Borchardt, Daniel S. Sawyer, William T. Estler, K Eberhardt, M Levenson, Marjorie A. McClain, Ted Hopp

We describe a Monte Carlo simulation technique where known information about a metrology system is employed as a constraint to distinguish the errors associated