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Journals

High-Frequency Dielectric Measurements: A Tutorial

Author(s)
James R. Baker-Jarvis, Michael D. Janezic, Donald C. DeGroot
KNOWLEDGE of the response of materials to electromagnetic (EM) fields in the frequency range of radio frequency (RF) through terahertz (THz) is critical to

Internal quantum efficiency modeling of silicon photodiodes

Author(s)
Thomas R. Gentile, Steven W. Brown, Keith R. Lykke, Ping-Shine Shaw, John T. Woodward IV
Results are presented for modeling of the internal quantum efficiency (IQE) of silicon photodiodes in the 400 nm to 900 nm wavelength range. The IQE data are

Rheology and Setting of High Volume Fly Ash Mixtures

Author(s)
Dale P. Bentz, Chiara F. Ferraris
While high volume fly ash (HVFA) concretes can be designed and produced to meet 28-d strength requirements and often even exceed the durability performance of

From the Editor's Desk: Where to Go

Author(s)
Catherine A. Remley
This is an Editorial for the April, 2010 issue of IEEE Microwave Magazine. Kate Remley, the Editor-in-Chief, writes about timely topics for the members of the

On Hash Functions Using Checksums

Author(s)
Praveen Gauruvarum, John M. Kelsey, L. Knudsen, S. Thomsen
We analyse the security of iterated hash functions that compute an input dependent checksum which is processed as part of the hash computation. We show that a

Clifford Glenwood Shull

Author(s)
Robert D. Shull
In 1975 Clifford Glenwood Shull was elected to membership in the National Academy of Science. He had earlier, 1956, been admitted to the American Academy of

Sensitivity of coherent dual-comb spectroscopy

Author(s)
Nathan R. Newbury, Ian R. Coddington, William C. Swann
Coherent dual comb spectroscopy can provide high-resolution, high-accuracy measurements of a sample response in both magnitude and phase. We discuss the

Data Loss Prevention

Author(s)
Simon Liu, D. Richard Kuhn
In today's digital economy, data enters and leaves enterprises' cyberspace at record rates. For a typical enterprise, millions of emails are sent and received

Wrinkling and Strain Softening in Single-Wall Carbon Nanotube Membranes

Author(s)
Erik K. Hobbie, Daneesh O. Simien, Jeffrey A. Fagan, JiYeon Huh, Jun Y. Chung, Steven D. Hudson, Jan Obrzut, Jack F. Douglas, Christopher M. Stafford
Ultrathin layers of single-wall carbon nanotubes (SWCNTs) show considerable promise for applications ranging from fuel-cell membranes and biochemical sensors to
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