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Journals

AMRF Process Planning System

Author(s)
Charles R. McLean, Peter Brown
As more intelligent automated control systems are introduced into discrete parts manufacturing facilities, it will become increasingly difficult to maintain the

Scanning Electron Microscopy with Polarized Electrons

Author(s)
John Unguris, G Hembree, Robert Celotta, Daniel T. Pierce
The recent joining of scanning electron microscopy and electron spin polarization analysis has greatly improved the ability to study magnetic microstructure. By

Free Electron-Like Stoner Excitation in Fe

Author(s)
David R. Penn
Methods have recently developed to probe the Stoner excitation spectrum which has not been amenable to study by neutron diffraction. The experiments have
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