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Journals

Damage Processes in Ceramics Resulting from Diamond Tool Indentation and Scratching in Various Environments

January 1, 1995

Author(s)

A Ruff, H Shin, Christopher J. Evans

Studies have been carried out to determine the influence of different chemical environments and tool shapes on damage produced during diamond tool scratching...

Enhanced Machinability of Silicon Carbide via Microstructural Design

January 1, 1995

Author(s)

Nitin P. Padture, Christopher J. Evans, Hockin D. Xu, Brian R. Lawn

The machinability of a heterogeneous silicon carbide with weak interphase boundaries, elongated grains, and high internal stresses is evaluated relative to a...

The IGES/PDES Organization (IPO) 1994 Annual Report

January 1, 1995

Author(s)

Joan Wellington, Bill Conroy

The IGES/PDES Organization (IPO) 1994 Annual Report presents a general overview of the IPO''s accomplishments for 1994, gives details of accomplishments of the...

Making Displays Deliver a Full Measure

January 1, 1995

Author(s)

Herbert S. Bennett, Charles D. Fenimore, B. F. Field, Edward F. Kelley

Halon Thermochemistry: Ab Initio Calculations of the Enthalpies of Formation of Fluoromethanes

January 1, 1995

Author(s)

R. J. Berry, Donald R. Burgess Jr., Marc R. Nyden, Michael R. Zachariah, M Schwartz

Atomic equivalent (AEQ), BAC-MP4, G2(MP2), G2, CBS-4, BCS-Q, and CBS-QCI/APNO molecular orbital calculations were used to calculate enthalpies of formation in...

Effects of Temperature Variation

January 1, 1995

Author(s)

H Kirchmayr, Loren F. Goodrich

Critical Curent Measurement Methods: Quantitative Evaluation

January 1, 1995

Author(s)

Loren F. Goodrich, A N. Srivastava

Thermal Contraction of Materials Used in Nb3Sn Critical Current Measurements

January 1, 1995

Author(s)

Loren F. Goodrich, A N. Srivastava

Frequency Measurements and Analysis of CO₂ 00⁰-[10⁰1,02⁰1]_I,II Sequence Band Transitions

January 1, 1995

Author(s)

Che-Chung Chou, A. G. Maki, A G. Tochitsky, S, Ja. Tochitsky, Jow-Tsong Shy, K M. Evenson, L R. Zink

Increasing the Value of Atomic Force Microscopy Process Metrology Using a High-Accuracy Scanner, Tip Characterization, and Morphological Image Analysis

January 1, 1995

Author(s)

J Schneir, John S. Villarrubia, T Mcwaid, V W. Tsai, Ronald G. Dixson

Atomic force microscopes are being used increasingly for process metrology. As a case study, the measurement by atomic force microscope of a soda lime glass...

Nonstationary Behavior of Partial Discharge During Discharge-Induced Aging of Dielectrics

January 1, 1995

Author(s)

Richard J. Van Brunt, P. Von, T. Las

Physical Basis for Half-Integral Shapiro Steps in a dc SQUID

January 1, 1995

Author(s)

E A. Early, Alan F. Clark, C. J. Lobb

Prompt Gamma Activation Analysis Enhanced by a Neutron Focusing Capillary Lens

January 1, 1995

Author(s)

H. Chen, David F. Mildner, Robert Gregory Downing, R.L. Paul, Richard M. Lindstrom, Cynthia J. Zeissler, Q.F. Xiao, V.A. Sharov

CMAC Neural Network Control for High Precision Motion Control in Presence of Large Friction

January 1, 1995

Author(s)

G Larson, Alkan Donmez, S Cetinkunt

Development of Rockwell Hardness Standards: From Performance Comparisons to Fundamental Metrology

January 1, 1995

Author(s)

J Smith, Jun-Feng Song, F Rudder, Theodore V. Vorburger

Based on the Rockwell diamond indenter's microform calibrations recently developed at NIST, as well as a deadweight standardized Rockwell hardness machine, the...

Thermal Component Models for Electrothermal Network Simulation

December 31, 1994

Author(s)

Allen R. Hefner Jr., David L. Blackburn

Testing for Metrological Accuracy of the Electron Pump

December 31, 1994

Author(s)

John M. Martinis, M. Nahum, H. D. Jensen

Novel Hot-Electron Microbolometer

December 31, 1994

Author(s)

M. Nahum, John M. Martinis

Performance of the Electron Pump with Stray Capacitances

December 31, 1994

Author(s)

H. D. Jensen, John M. Martinis

Electron Beam Interaction Modeling as Applied to X-Ray Lithography Mask SEM Linewidth Metrology

December 31, 1994

Author(s)

Michael T. Postek, J R. Lowney, Andras Vladar, William J. Keery, E Marx, Robert D. Larrabee

The Interaction of Stoichiometry, Mechanical Stress and Interface Trap Density in LPCVD Si-Rich SiNx-Si Structures

December 31, 1994

Author(s)

S C. Witczak, Michael Gaitan, John S. Suehle, M. C. Peckerar, M T. Ma

Electrical Characterization of Liquid-Phase Epitaxially Grown Single-Crystal Films of Mercury Cadmium Telluride by Variable-Magnetic-Field Hall Measurements

December 31, 1994

Author(s)

Jin S. Kim, David G. Seiler, Luigi Colombo, M. C. Chen

Vision-Based Robotic Convoy Driving

December 30, 1994

Author(s)

H Schneiderman, M Nashman, Albert J. Wavering, Ronald Lumia

Vision, Mobility, Unmanned Systems, Robotics & Intelligent Systems

SERRS OF AZURIN ADSORBED ON A SILVER SURFACE

December 1, 1994

Author(s)

Vitalii I. Silin, Adolfas K. Gaigalas

A Discriminating Feature Tracker for Vision-Based Autonomous Driving

December 1, 1994

Author(s)

H Schneiderman, M Nashman

Influence of Film Thickness and Air Gaps in Surface Impedance Measurements of High Temperature Superconductors Using the Dielectric Resonator Technique

December 1, 1994

Author(s)

J. G. Ceremuga, Jerzy Krupka, Richard G. Geyer, J. Modelski

An Integral Occurring in Coherence Theory

December 1, 1994

Author(s)

Ronald C. Wittmann, Bradley Alpert

Coexistence of Grains with Differing Orthorhombicity in High Quality YBCO Thin Films

December 1, 1994

Author(s)

E. I. DeObaldia, K. F. Ludwig, A. M. Clark, W. J. Skocpol, P. M. Mankiewich, David A. Rudman, Alexana Roshko, R. Moerman, Leila R. Vale, Ronald H. Ono

Electronic Microrefrigerator Based on a Normal-Insulator-Superconductor Tunnel Junction

December 1, 1994

Author(s)

M. Nahum, Travis M. Eiles, John M. Martinis

Scaling of the Nonlinear Optical Cross Sections of GaAs-AlGaAs Multiple Quantum-Well Hetero n-i-p-i's

December 1, 1994

Author(s)

D. S. McCallum, A. N. Cartwright, Arthur L. Smirl, W. F. Tseng, Joseph G. Pellegrino, J. Comas

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