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Conferences

Entangled States of Atomic Ions for Quantum Metrology and Computation

Author(s)
David J. Wineland, C Monroe, D M. Meekhof, B E. King, Dietrich G. Leibfried, Wayne M. Itano, James C. Bergquist, D J. Berkeland, John J. Bollinger, J D. Miller
A single trapped 9Be+ ion is used to investigate Jaynes-Cummings dynamics for a two-level atomic system coupled to harmonic atomic motion. We create and

New NIST-Certified Length Microscale

Author(s)
James E. Potzick
The National Institute of Standards and Technology is developing a simple one-dimension certified pitch standard (or scale) covering the range 1 um to 10 mm

Development of Virtual Machine Tools

Author(s)
M A. Donmez
This paper describes a new project that is part of a program initiated by the Manufacturing Engineering Laboratory of the National Institute of Standards and

Optical Overlay Metrology at NIST

Author(s)
Richard M. Silver, Amy Singer, L Carroll, S Berg-cross, James E. Potzick
Many of the significant challenges in making accurate overlay registration measurements are discussed. An understanding of the causes of the errors affecting
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