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Books

Ductile-Regime Grinding of Brittle Materials

January 1, 1997

Author(s)

Kenneth Blaedel, John S. Taylor, Christopher J. Evans

Under appropriate conditions, brittle materials may be ground to produce surfaces with no observable fracture damage. This chapter reviews the techniques for...

Wire Bonding to Multichip Modules and Other Soft Substrates, Multichip Modules with Integrated Sensors

December 31, 1996

Author(s)

George G. Harman

Beyond Product Design Data: Data Standards for Manufacturing Resources

August 1, 1996

Author(s)

Kevin K. Jurrens, Mary B. Algeo, James E. Fowler

The benefits of industrial standards are well-known. They facilitate common markets, influence marketing patterns, and augment the operations of distributed...

Semiconductor Characterization: Present Status and Future Needs

January 3, 1996

Author(s)

W M. Bullis, David G. Seiler, A C. Diebold

Doppler Free Spectroscopy, ed. by R.G. Hulet and F.B. Dunning

January 1, 1996

Author(s)

James C. Bergquist

NIST Atomic Transition Probability Tables (revised and enlarged edition)

January 1, 1996

Author(s)

Jeffrey R. Fuhr, Wolfgang L. Wiese

A Review of the Methods of Distributing Time and Frequency, ed. by W. Ross Stone

January 1, 1996

Author(s)

Judah Levine

Free Radical Sources

January 1, 1996

Author(s)

K M. Evenson, J M. Brown

New Developments in Primary Atomic Frequency Standards, ed. by W. Ross Stone

January 1, 1996

Author(s)

Robert E. Drullinger, Wayne M. Itano, S L. Rolston

Photoemission and Optical Properties of C₆₀ Fullerites, ed. by J.R. Chelikowsky and S.G. Louie

January 1, 1996

Author(s)

Eric L. Shirley, S G. Louie

Excited Level Lifetime Measurements, ed. by F.B. Dunning and R.G. Hulet

January 1, 1996

Author(s)

Thomas R. O'Brian, J E. Lawler

A Consistent Set of Conversion Coefficients for Personnel and Environmental Dosimetry

January 1, 1996

Author(s)

Christopher G. Soares, P R. Martin

A Radiochromic Solid State Polymerization Reaction, ed. by R.L. Clough, J.H. O'Donnell and S.W. Shalaby

January 1, 1996

Author(s)

W L. Mclaughlin, M Al-sheikhly, D F. Lewis, A Kov{aacute}cs, L Wojn{aacute}rovits

Interpenetrating Polymer Network (IPN) Formation by Electron-Beam Curing of Acrylated Epoxy Resin Blends, eds. R.L. Clough, J.H. O'Donnell and S.W. Shalaby

January 1, 1996

Author(s)

M Al-sheikhly, W L. Mclaughlin

Laser Cooling of Neutral Atoms for Frequency Standards, ed. by J. Bergquist

January 1, 1996

Author(s)

William D. Phillips, C Ekstrom, W Golding, S L. Rolston

Laser Cooling and Electromagnetic Trapping of Neutral Atoms, ed. by A. Aspect, W. Barletta, and R. Bonifacio

January 1, 1996

Author(s)

William D. Phillips

Spectroradiometers for Deep-Ultraviolet Lithography, ed. by W.M. Bullis, D.G. Seiler, and A.C. Diebold

January 1, 1996

Author(s)

John M. Bridges, Jonathan E. Hardis, C L. Cromer, J R. Roberts

Atom Optics: Using Light to Position Atoms,

January 1, 1996

Author(s)

Jabez J. McClelland, M Prentiss

Active/passive vibration isolation at 1 Hz and above. Part II. Main Stages

January 1, 1996

Author(s)

S J. Richman, D B. Newell, R T. Stebbins, P L. Bender, J E. Faller

Active/passive vibration isolation at 1 Hz and above. Part I. Single stage, six degrees of freedom

January 1, 1996

Author(s)

D B. Newell, S J. Richman, R T. Stebbins, P G. Nelson, J E. Mason, P L. Bender, J E. Faller

A new modulation method for sensitive nonlinear spectroscopy - Applications to molecular overtones as visible frequency references, ed. by M. Inguscio, M. Allegrini and A. Sasso

January 1, 1996

Author(s)

L -. Ma, Jun Ye, P Dube, John L. Hall

Evidence for Bose-Einstein Condensation in a Dilute Atomic Vapor, ed. by M. Inguscio, M. Allegrini and A. Sasso

January 1, 1996

Author(s)

M H. Anderson, J R. Ensher, M R. Matthews, C E. Wieman, Eric A. Cornell

TOM: A Target Optical Monitor of Polarization and Luminosity for Polarized Internal Gas Targets, ed. by H. Paetz Gen. Schieck and L. Sydow

January 1, 1996

Author(s)

M L. Pitt, K Ackerstaff, R W. Carr, G R. Court, D Deschepper, A Dvoredsky, Thomas R. Gentile, A Golendoukhin, J F. Kelsey, W Korsch, L H. Kramer, Y Li, R D. Mckeown, R G. Milner, M Niczyporuk, S F. Pate, T Shin, J Sowinski, E Steffens, J Stewart, F Stock, T Wise, K Zapfe-duren

Pilot Studies for Improving Sampling Protocols, ed. by L.H. Keith

January 1, 1996

Author(s)

W S. Liggett, Kenneth G. Inn

Counting Radioactivity, ed. by J.C. Harbert, W.C. Eckelman, and R.D. Neumann

January 1, 1996

Author(s)

J C. Harbert, Bert M. Coursey

Radiation Detector Systems, ed. by J.C. Harbert, W.C. Eckelman, and R.D. Neumann

January 1, 1996

Author(s)

J C. Harbert, Bert M. Coursey

Bragg Scattering from Optical Lattices, ed. by M. Inguscio, M. Allegrini, and A. Sasso

January 1, 1996

Author(s)

M Gatzke, G Birkl, I H. Deutsch, S L. Rolston, William D. Phillips

Theory of Bose-Einstein Condensed Trapped Atoms, ed. by K. Burnett

January 1, 1996

Author(s)

N P. Proukakis, Karen G. Burnett, M Edwards, R J. Dodd, Charles W. Clark

Progress Towards Accurate Metrology Using Atomic Force Microscopy

January 1, 1996

Author(s)

T Mcwaid, J Schneir, John S. Villarrubia, Ronald G. Dixson, V W. Tsai

Accurate metrology using atomic force microscopy (AFM) requires accurate control of the tip position, an estimate of the tip geometry, and an understanding of...

Lightwave Metrology: Optical Fibers and Power Meters

January 1, 1996

Author(s)

B. L. Danielson, Timothy J. Drapela, Douglas L. Franzen, S. E. Mechels, Thomas Scott, Igor Vayshenker, M. Young

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