We are developing statistical methods to enable measurement science and metrology for MGI (project started in 2011).
We focus on research and development of statistical methods to enable new measurement science and metrology relevant to MGI. In particular, we illustrate our methods for examples from near-field scanning probe microwave microscopy (NSSM) for characterization, development, and modeling of novel materials, and the electronic measurement of the the Boltzmann constant based on Johnson noise thermometry. We expect our methods to apply to a broad range of metrological and material characterization studies relevant to MGI.
Raw and processed near-field scanning microwave microscopy (NSSM) images of a GaN nanowire on the MML data repository at https://materialsdata.nist.gov/dspace/xmlui/handle/11256/783.
Publications (archival journals)
Publications (conference proceedings)