Thomas Mitchell Wallis

Publications

Microwaves and Microscopy (Guest Editorial)

September 16, 2020

Author(s)

Thomas M. Wallis, Marco Farina

Welcome to this special issue of IEEE Microwave Magazine, which is focused on the topic of Microwaves and Microscopy. As that title implies, this topic lies

Imaging Carrier Inhomogeneities in Ambipolar Tellurene Field Effect Transistors

February 12, 2020

Author(s)

Samuel Berweger, Gang Qiu, Yixiu Wang, Benjamin Pollard, Kristen L. Genter, Thomas M. Wallis, Wenzhuo Wu, Peide Ye, Pavel Kabos

Bipolar transport underpins a wide range of semiconductor homojunction device functionalities such as pn junctions or transistors. The capability to image and

Design of an intelligent PYTHON code to run coupled and license-free finite-element and statistical analysis software for calibration of near-field scanning microwave microscopes

October 2, 2019

Author(s)

Jeffrey T. Fong, Nathanael A. Heckert, James J. Filliben, Pedro V. Marcal, Samuel Berweger, Thomas M. Wallis, Pavel Kabos

To calibrate near-field scanning microwave microscopes (NSMM) for defect detection and characterization in semiconductors, it is common to develop a parametric

Disentangling topographic contributions to near-field scanning microwave microscopy images

February 1, 2019

Author(s)

Samuel Berweger, Thomas M. Wallis, Pavel Kabos, Kevin J. Coakley

We develop empirical models to predict the contribution of topographicvariations to near-field scanning probe microwave microscopy (NSSM)images.In particular

Chapter 14. Nanoscale electromagnetic measurements for life science applications

September 17, 2017

Author(s)

Thomas M. Wallis, Pavel Kabos

Historically, the most prominent techniques for biomaterial imaging have been optical techniques, especially those based on fluorescence imaging. Many of these

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