Thomas Mitchell Wallis

Publications

Disentangling topographic contributions to near-field scanning microwave microscopy images

February 01, 2019

Author(s):

Samuel Berweger, Thomas M. Wallis, Pavel Kabos, Kevin J. Coakley

We develop empirical models to predict the contribution of topographicvariations to near-field scanning probe microwave microscopy (NSSM)images.In particular,...

Chapter 13. Dynamics of nanoscale magnetic systems

September 17, 2017

Author(s):

Thomas M. Wallis, Pavel Kabos

The topic of nanoscale magnetic systems is broad and could easily provide enough material for an entire book on its own. In this chapter, as in previous ones,...

Chapter 12 Depth profiling

September 17, 2017

Author(s):

Thomas M. Wallis, Pavel Kabos

Microwave tomography is an active, developing research area. The objective is to visualize hidden, subsurface features through application of microwave...

Chapter 11. Dopant profiling in semiconductor nanoelectronics

September 17, 2017

Author(s):

Thomas M. Wallis, Pavel Kabos

As nanoelectronic device dimensions are scaled down to atomic sizes, device performance becomes more and more sensitive to the exact arrangement of atoms,...

Chapter 10. Measurement of active nanoelectronic devices

September 17, 2017

Author(s):

Thomas M. Wallis, Pavel Kabos

Many of the most promising applications of nanomaterials involve active, nanoelectronic devices. For example, the intrinsic transport properties of single-...