Samuel Berweger

Publications

Disentangling topographic contributions to near-field scanning microwave microscopy images

February 01, 2019

Author(s):

Samuel Berweger, Thomas M. Wallis, Pavel Kabos, Kevin J. Coakley

We develop empirical models to predict the contribution of topographicvariations to near-field scanning probe microwave microscopy (NSSM)images.In particular,...

Electronic and Morphological Inhomogeneities in Pristine and Deteriorated Perovskite Photovoltaic Films

February 02, 2017

Author(s):

Samuel Berweger, Gordon A. MacDonald, Mengjin Yang, Kevin J. Coakley, Joeseph Berry, Kai Zhu, Frank W. DelRio, Thomas M. Wallis, Pavel Kabos

Methylammonium lead iodide grain boundaries exhibit depth-dependent electrical properties

September 23, 2016

Author(s):

Gordon A. MacDonald, Mengjin Yang, Samuel Berweger, Jason P. Killgore, Pavel Kabos, Joeseph Berry, Kai Zhu, Frank W. DelRio

In this letter, the nanoscale through-film and lateral photoresponse and conductivity of large-grained methylammonium lead iodide thin films are studied. In...

Near-field microwave microscopy of one-dimensional nanostructures

May 23, 2016

Author(s):

Samuel Berweger, Paul T. Blanchard, Rebecca C. Quardokus, Frank W. DelRio, Thomas M. Wallis, Pavel Kabos, Sergiy Krylyuk, Albert Davydov

With the ability to measure sample conductivity with nanometer spatial resolution, scanning microwave microscopy (SMM) is a powerful tool to study nanoscale...

Near-field control and imaging of free charge carrier variations in GaN nanowires

February 15, 2016

Author(s):

Samuel Berweger, Paul T. Blanchard, Matthew D. Brubaker, Kevin J. Coakley, Norman A. Sanford, Thomas M. Wallis, Kristine A. Bertness, Pavel Kabos

Despite their uniform crystallinity, the shape and faceting of semiconducting nanowires (NWs) can give rise to variations in structure and associated...