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International committee work
The Sensor Science Division participates in a number of technical committees in international and national standardization organizations.
American Petroleum Institute (API)
American National Standards Institute (ANSI)
American Society of Mechanical Engineers (ASME)
American Society for Testing and Materials (ASTM)
International Commission on Illumination (CIE)
International Committee for Weights and Measures (CIPM)
Council for Optical Radiation Measurements (CORM)
International Electrotechnical Commission (IEC)
Illuminating Engineering Society (IES)
International Organization for Standardization (ISO)
Quantitative Imaging Biomarker Alliance (QIBA)
Range Commanders Council (RCC)
Radiological Society of North American (RSNA)
Semiconductor Equipment and Materials International (SEMI)
*We have provided links to these sites because they have information that may be of interest to our users. NIST does not necessarily endorse the views or the facts presented on these sites. Further, NIST does not endorse any commercial products that may be advertised or available on these sites. By selecting these links, you will be leaving NIST webspace.
American Petroleum Institute (API)
| Field Standard Test Measures (Chapter 4.7) – J. Wright, Member |
| Flomeko Organizing Committee – J. Wright, Member |
| International Symposium for Fluid Flow Measurement Organizing Committee – J. Wright, Member |
| Uncertainty Working Group (Chapter 13.3) – J. Wright, Member |
| US National Work Group for the Development of Hydrogen Measurement Standards – J. Wright, Expert |
American National Standards Institute (ANSI)
Working Group C78-09 Light sources – Y. Ohno, C. Miller, and Y. Zong, Members)
American Society of Mechanical Engineers (ASME)
Measurement of Gas Flow by Means of Critical Flow Venturi Nozzles – A. Johnson and J. Wright, Experts
American Society for Testing and Materials (ASTM)
| Color and appearance (E012) – C. Miller, M. Nadal, and Y. Ohno, Members |
| > Color and Appearance Analysis (SC.04) – M. Nadal, Member |
| > Geometry (SC.03) – M. Nadal, Member |
| > High Visibility Materials for Individual Safety (SC.08) – C. Miller, Member |
| > Metallic and Pearlescent Color (SC.12) – M. Nadal, Member |
| > Precision and Bias (SC.93) – M. Nadal, Chair |
| > Retroreflection (SC.10) – C. Miller, Member |
| > Spectrophotometry and Colorimetry (SC.02) – M. Nadal, Member |
| > Terminology (SC.01) – M. Nadal, Member |
| > Visual Methods (SC.11) – C. Miller, Member |
| > Flashing Lights (WG.05) – C. Miller, Chair |
| Liquid in Glass Thermometers and Hydrometers (E20.05) – J. Wright, Expert |
| Molecular Spectroscopy and Chromatography (E013) – D. Allen, and G. Fraser, Members |
| Nondestructive Testing (E007) |
| > Emerging NDT Methods (SC.10) |
| > Infrared Methods (WG.04) – B. Tsai, Member |
| > Visual/Optical Methods (WG.03) – B. Tsai, Member |
| Petroleum Products and Lubricants (D02) – D. Cross, Member |
| Solar, Geothermal, and Other Alternative Energy Sources (E044) |
| > Photovoltaic Electrical Power Conversion (SC.09) – G. Eppeldauer, Member |
| Space Simulation and Applications of Space Technology (E021) |
| > Thermal Protection (SC.08) – C. Gibson, Member |
| > Space Simulation Test Methods (SC.04) – L. Hanssen, Member |
| Temperature Measurement (E020) – D. Allen, B. Tsai, and H. Yoon, Members; D. Cross, Secretary |
| > Digital Contact Thermometers (SC.09) – D. Cross, Member |
| > Liquid-In-Glass Thermometers and Hydrometers (SC.05) – D. Cross, Co-Chair |
| > Mercury Initiative (E20.90) – D. Cross, Chair |
| > Radiation Thermometry (SC.02) – C. Gibson and B. Tsai, Members |
International Commission on Illumination (CIE)
| Board of Administration (C004) - Y. Ohno, Member |
| US National Committee/CIE (C002) - Y. Ohno and R. Datla, Members; C. Miller, Vice President |
| Measurement of Light and Radiation (DIV.02) - Y. Ohno, Director |
| > CIE/ISO Standard on Retroreflection Measurements (TC 2.56) - C. Miller, Chair |
| > Characterization and Calibration Methods of UV Radiometers (TC 2.47) - G. Eppeldauer and T. Larason, Members |
| > Characterizing the Performance of Illuminance and Luminance Meters (TC 2.40) - Y. Ohno, Member |
| > Detector Linearity (TC 2.29) - T. Larason, Member; G. Eppeldauer, Chair |
| > Determination of Measurement Uncertainties in Photometry (TC 2.43) - Y. Ohno, Member |
| > Effect of Instrumental Bandpass Function & Measurement Interval on Spectral Quantities (TC 2.60) - Y. Ohno, Member |
| > LED Intensity Measurements (TC 2.46) - Y. Ohno, Member |
| > Measurement of LED Radiance and Luminance (TC 2.58) - Y. Ohno, Member |
| > Measurement of Optical Properties of LED Clusters and Arrays (TC 2.50) - Y. Ohno, Member |
| > Photometry of Flashing Light (TC 2.49) - Y. Ohno, Chair |
| > Photometry Using Detectors as Transfer Standards (TC 2.37) - Y. Ohno, Chair |
| > Vocabulary Matters (TC 2.44) - Y. Ohno, Member |
| Standardization of Broad-Band Ultraviolet Measurements - G. Eppeldauer, Reporter |
| Vision and Colour (DIV.01) |
| > Standards in Colorimetry - Y. Ohno, Member |
International Committee for Weights and Measures (CIPM)
| Consultative Committee for Mass (CCM) |
| > Working Group for Fluid Flow (WG-FF) - J. Wright, Chair |
| Consultative Committee for Photometry and Radiometry (CCPR)(C001) - Y. Ohno, Member |
| > Working Group on Key Comparison (WG-KC) - Y. Ohno, Chair |
| Consultative Committee for Thermometry (CCT)(C010) |
| > MePK (WG.01) - H. Yoon, Representative |
| > Primary Thermometry (WG.04) - M. Moldover, Member |
| > Radiation Thermometry (WG.05) - H. Yoon, Representative |
| > Secondary Contact Thermometers (WG.02) - D. Cross, Member |
| > Thermophysical Properties (WG.09) - L. Hanssen, Representative |
| > Task Group on the SI (TG-SI) - L. Hanssen, Representative |
Council for Optical Radiation Measurements (CORM)
| Optical Properties of Materials (C003) |
| > Measurement Geometry (OP-2) - L. Hanssen, Member |
| > Optical Properties of Materials (OP-5) - L. Hanssen and S. Kaplan, Members |
| CORM Radiometry (C002) - C. Miller, Member |
| > Photometry (CR-3) - Y. Ohno, Member, and C. Miller, Chair |
| > Electronic Displays (CR-5) - Y. Ohno, Member |
International Electrotechnical Commission (IEC)
| Nanotechnology Standardization for Electrical and Electronic Products and Systems (TC 113) – T. Germer, Expert |
| Audio, Video and Multimedia Systems and Equipment (TC100) |
| > Colour Measurement and Management (TA 2) – Y. Ohno, Member |
| Measurement and Control Devices (SC 65B) |
| > Temperature Sensors and Instruments (WG 5) – H. Yoon, Member |
Illuminating Engineering Society (IES)
| Light Sources (C008) – C. Miller, Member |
| Testing Procedures (C006) - C. Miller and Y. Ohno, Members |
| > Solid State Lighting (S) - C. Miller, Chair, and Y. Ohno, Member |
International Organization for Standardization (ISO)
| Optics and Photonics (TC172) |
| > Optical Materials and Components (SC.03) |
| > Characterization of IR Materials (WG.03) – L. Hanssen, Expert |
| > Coatings (WG.02) – L. Hanssen, Expert |
| Quantities, Units, Symbols, Conversion Factors (TC012) - Y. Ohno, Member |
Quantitative Imaging Biomarker Alliance (QIBA)
COPD-Asthma Technical Committee – Z. Levine, Member
Range Commanders Council (RCC)
Signature Measurements Standards Group (SMSG) – L. Hanssen, Representative
Radiological Society of North America (RSNA) – Z. Levine, Member
Semiconductor Equipment and Materials International (SEMI)
| Micropatterning (C020) – T. Germer, Member |
| > Standards for Scatterometry (TF.01) – T. Germer, Chair |
| Silicon Wafer (C001) – T. Germer, Member |
| > Advanced Surface Inspection (TF.01) – T. Germer, Member |
Contacts
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SSDWEB(301) 975-3727100 Bureau Drive
M/S 8440
Gaithersburg, MD 20899-8440