Vladimir Oleshko (Fed)

• Dr. Oleshko has more than 20 years of experience in research of engineered functional materials (catalysts, structural alloys, polymers, ceramics, composites, materials for batteries and imaging systems, sensors), processing and characterization of a wide range of nanostructured photo-/electrochemically active catalytic, electronic and optical materials and broad expertise with materials characterization by electron microscopy (HRTEM, STEM, EDXS/EFTEM/ EELS/spectral imaging; cryo-EM, in situ environmental TEM, tomography; low-voltage (FE)SEM, variable-pressure SEM, in-SEM Raman) and other instrumental techniques.
• He holds 9 US/international patents and patent applications and has published/coauthored over 200 publications in peer-reviewed journals, including 5 book chapters, 2 encyclopedia articles and 3 review papers.

Research interests:

1) Structure-property relationships in functional materials

2) Discovery-based materials characterization using advanced analytical nanoscopy and spectroscopy methods

3) Transformations of nanostructures, size-confinement (quantum) effects, electron excitations and plasmonics

1. Best Microscopy and Microanalysis Paper Award in Materials Applications from the Microscopy Society of America (2017).
2. Outstanding Invention Award in the Physical Science by Office of Technology Commercialization, University of Maryland, College Park, MD for Nanoengineered Chemical Sensors That Offer Superior Detection of Environmental Pollutants, Hydrogen, and Other Industrial Chemicals (2012).
3. Five Intel F12/22/32 Goodie Drawer Awards and Intel Award in recognition of technical support during the mission critical P1264.5 shrink startup activities in AZ F12 (2006-2007).
4. 2^nd Place Award at the International Metallographic Society Contest in Electron Microscopy – Transmission and Analytical (2005)