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Thomas A. Germer (Fed)
Dr. Germer, a researcher in the field of optics at surfaces, has been at NIST since 1992 and is currently the leader of the Surface and Interface Metrology Group. His main interests involve the measurement and interpretation of light scattering from surfaces, optical polarization measurements, optics of structured surfaces, optical imaging theory, and general spectrophotometry.
He has received the Department of Commerce Bronze Medals in 1997 and 2020 and a Silver Medal in 2010, the Judson C. French Award in 2018, the NIST Chapter of Sigma Xi Young Scientist Award in 2001, was elected Fellow of SPIE 2008 and Optica in 2023.
Dr. Germer is a member of the Sensor Science Division's Optical Properties of Materials focus program.
Research projects
Bidirectional Optical Scattering Facility
Optical Scattering Software
SCATMECH: Polarized Light Scattering C++ Class Library
Modeled Integrated Scatter Tool (MIST)
Biomedical Optics
Optical Grating Scatterometry
Focused beam spectroscopic ellipsometer
Nanoscale Optical Imaging
Optical Polarization Metrology
