Pragya R. Shrestha is an Electrical Engineer in Advanced Electronics Group in the Nanoscale Device Characterization Division at NIST. Her previous work includes developing innovative electrical device characterization techniques for novel devices and developing highly sensitive broadband ESR (Electron Spin Resonance) technique relevant to a wide-ranging spectrum of material system. Her current focus is device and circuits characterization at low temperatures and ultra-fast time dependent measurement of device operation to understand device physics and reliability at cryogenic temperatures.