Pavel Kabos

Publications

Disentangling topographic contributions to near-field scanning microwave microscopy images

February 01, 2019

Author(s):

Samuel Berweger, Thomas M. Wallis, Pavel Kabos, Kevin J. Coakley

We develop empirical models to predict the contribution of topographicvariations to near-field scanning probe microwave microscopy (NSSM)images.In particular,...

Chapter 10. Measurement of active nanoelectronic devices

September 17, 2017

Author(s):

Thomas M. Wallis, Pavel Kabos

Many of the most promising applications of nanomaterials involve active, nanoelectronic devices. For example, the intrinsic transport properties of single-...

Chapter 9. Radio frequency scanning probe measurements of materials

September 17, 2017

Author(s):

Thomas M. Wallis, Pavel Kabos

Preceding chapters have described the near field scanning microwave microscope (NSMM), while discussing both the underlying theory of operation and practical...

Chapter 6. Characterization of nanofiber devices

September 17, 2017

Author(s):

Thomas M. Wallis, Pavel Kabos

Previous chapters have introduced and described a variety of measurement techniques for RF nanoelectronic devices. Here, our objective is to work through an...

Chapter 8. Instrumentation for near-field scanning microwave microscopy

September 17, 2017

Author(s):

Pavel Kabos, Thomas M. Wallis

In the previous chapter, we discussed the underlying physics and theory of operation for near-field scanning microwave microscopes (NSMMs) and related probe-...