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Jay H. Hendricks (Fed)

A world-class expert in low pressure and vacuum metrology, Dr. Hendricks serves as the Deputy Program Manager for NIST on a Chip and is the former leader of the NIST Thermodynamic Metrology Group. Jay received his M.A. and Ph.D. in physical chemistry from Johns Hopkins University, and his B.S. in chemistry from Penn State University. In 1996, he started his career at NIST as a post-doctoral fellow conducting research on a novel low-temperature CVD that resulted in a US patent.

Jay has over 30 years of vacuum science and technology experience and has worked on many aspects of vacuum technology and metrology. He was team lead of a 5-year Innovation in Measurement Science project aimed at re-inventing the realization and dissemination of pressure, temperature, and length using optical Fabry-Perot interferometer cavities. The research has resulted in a patent application, 12 publications, 6 invited talks and has fundamentally changed the way pressure and standards are be realized and disseminated with technology transfer to the private sector currently underway. His current research interests focus on development novel photonic methods for realizing traditional vacuum gauging and temperature metrology, dynamic measurements, and extreme vacuum production and measurement.

Dr. Hendricks has authored over 60 papers on vacuum science/ technology/ surface chemistry/ ion-beam laser spectroscopy. He has presented invited papers at both domestic and international vacuum symposia and has been a seminar instructor for the Measurement Science Conference 6 times. He is regularly sought out as invited/ key-note speaker (8 times over the past 5 years). Recent awards include the being named a Fellow of the AVS for exceptional contributions to vacuum science, developing new and revolutionary vacuum standards and methods, and mentorship to early career scientists and engineers the NIST French Award for development of a new NIST calibration service, and two US Department of Commerce Gold Medals for Fixed Length Optical Cavity (FLOC) and for his service in protecting US historical documents including the Waldseemüller Map, and Emancipation Proclamation, and the US bill of rights.

Dr. Hendricks leadership is nationally and internationally recognized is sought out on a variety of vacuum standards meetings, symposia program committees and vacuum societies. Most prominently, he is the Scientific Director of IUVSTA (International Union of Vacuum Science, Technique and Application) an organization representing nearly 15,000 physicists, chemists, materials scientists, engineers, and technologists who are linked through their common use of vacuum. He currently has active leadership roles in the AVS (American Vacuum Society), and IVC (International Vacuum Congress), and EVC (European Vacuum Congress) program planning committees.  He is an active member of the CCM Pressure and Vacuum working group piloting international key comparison, AVS-Mid Atlantic Chapter Executive Committee, where he organizes annual chapter meeting at NIST for the past 10 years, he is active on the ISO TC112 Vacuum Standards Committee where he reviews documents and standards, and is Chair of the IMEKO TC-16, an international technical committee for pressure and vacuum metrology.

Publications

The Expanding Role of National Metrology Institutes in the Quantum Era

Author(s)
Alexander Tzalenchuk, Nicolas Spethmann, Tim Prior, Jay H. Hendricks, Yijie Pan, Vladimir Bubanja, Guilherme Temporão, Dai-Hyuk Yu, Damir Ilić, Barbara L. Goldstein
Now that all base units are defined in terms of fundamental constants and can thus — at least in principle — be realized anytime and anywhere, rather than

A New Spin on Kibble: A Self Calibrating Torque Realization Device at NIST

Author(s)
Zane Comden, Stephan Schlamminger, Charles Waduwarage Perera, Frank Seifert, David B. Newell, Jay H. Hendricks, Barbara L. Goldstein, Leon Chao
After the 2019 redefinition of the International System of Units (SI), torque no longer needs to be traceable to a calibrated weight suspended from a known

Patents

OPTICAL REFRACTION BAROMETER

NIST Inventors
Kevin O Douglass , Stephen Eckel , Jacob Edmond Ricker and Jay H. Hendricks
patent description In short a method to improve upon the current FLOC system, for measuring pressure based on refractivity changes, by using a single laser and direct measure of the difference between the lasers without heterodyne measurement.
Image for 10,816,325

Deformometer for Determining Deformation of an Optical Cavity Optic

NIST Inventors
Zeeshan Ahmed , Kevin O Douglass , Stephen Eckel , Patrick Egan and Jay H. Hendricks
Patent description NIST has invented a pulse quantizer that uses arrays of one or more Josephson junctions to create a pulse voltage output that is immune to differential pulse timing shifts. When the output pulse patterns are used to encode a waveform, for example, the waveform will be free from

Deformometer for Determining Deformation of an Optical Cavity Optic

NIST Inventors
Zeeshan Ahmed , Kevin O Douglass , Stephen Eckel , Patrick Egan and Jay H. Hendricks
Patent Description NIST has developed a device that uses multiple wavelengths (colors) of light and/or multiple species of gas to independently measure the distortions imposed on an optical cavity, cell, or other optical element that holds gas due to the forces applied by the gas. The device
Created October 9, 2019, Updated September 7, 2022