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Jay H. Hendricks (Fed)

A world-class expert in low pressure and vacuum metrology, Dr. Hendricks serves as the Deputy Program Manager for NIST on a Chip and is the former leader of the NIST Thermodynamic Metrology Group. Jay received his M.A. and Ph.D. in physical chemistry from Johns Hopkins University, and his B.S. in chemistry from Penn State University. In 1996, he started his career at NIST as a post-doctoral fellow conducting research on a novel low-temperature CVD that resulted in a US patent.

Jay has over 30 years of vacuum science and technology experience and has worked on many aspects of vacuum technology and metrology. He was team lead of a 5-year Innovation in Measurement Science project aimed at re-inventing the realization and dissemination of pressure, temperature, and length using optical Fabry-Perot interferometer cavities. The research has resulted in a patent application, 12 publications, 6 invited talks and has fundamentally changed the way pressure and standards are be realized and disseminated with technology transfer to the private sector currently underway. His current research interests focus on development novel photonic methods for realizing traditional vacuum gauging and temperature metrology, dynamic measurements, and extreme vacuum production and measurement.

Dr. Hendricks has authored over 60 papers on vacuum science/ technology/ surface chemistry/ ion-beam laser spectroscopy. He has presented invited papers at both domestic and international vacuum symposia and has been a seminar instructor for the Measurement Science Conference 6 times. He is regularly sought out as invited/ key-note speaker (8 times over the past 5 years). Recent awards include the being named a Fellow of the AVS for exceptional contributions to vacuum science, developing new and revolutionary vacuum standards and methods, and mentorship to early career scientists and engineers the NIST French Award for development of a new NIST calibration service, and two US Department of Commerce Gold Medals for Fixed Length Optical Cavity (FLOC) and for his service in protecting US historical documents including the Waldseemüller Map, and Emancipation Proclamation, and the US bill of rights.

Dr. Hendricks leadership is nationally and internationally recognized is sought out on a variety of vacuum standards meetings, symposia program committees and vacuum societies. Most prominently, he is the Scientific Director of IUVSTA (International Union of Vacuum Science, Technique and Application) an organization representing nearly 15,000 physicists, chemists, materials scientists, engineers, and technologists who are linked through their common use of vacuum. He currently has active leadership roles in the AVS (American Vacuum Society), and IVC (International Vacuum Congress), and EVC (European Vacuum Congress) program planning committees.  He is an active member of the CCM Pressure and Vacuum working group piloting international key comparison, AVS-Mid Atlantic Chapter Executive Committee, where he organizes annual chapter meeting at NIST for the past 10 years, he is active on the ISO TC112 Vacuum Standards Committee where he reviews documents and standards, and is Chair of the IMEKO TC-16, an international technical committee for pressure and vacuum metrology.

Publications

Excess Electrons Bound to H2S Trimer and Tetramer Clusters

Author(s)
Gaoxiang Liu, Manuel D?az-Tinoco, Sandra M. Ciborowski, Svetlana Lyspustina, Jay H. Hendricks, Vincent Ortiz, Kit H. Bowen
The hydrogen sulfide trimer and tetramer anions, (H2S)3– and (H2S)4–, were generated by Rydberg electron transfer and studied via a synergy between velocity-map

Dual Cavity Refractivity measurements using a single Laser

Author(s)
Kevin O. Douglass, Jacob Edmond Ricker, Stephen Eckel, Jay H. Hendricks
We present a method for measuring refractivity-based pressure changes using a dual Fabry-Perot cavity utilizing a single laser with off-set sideband locking to

Patents

Deformometer for Determining Deformation of an Optical Cavity Optic

NIST Inventors
Zeeshan Ahmed, Kevin O Douglass, Stephen Eckel, Patrick Egan and Jay H. Hendricks
Patent Description NIST has developed a device that uses multiple wavelengths (colors) of light and/or multiple species of gas to independently measure the distortions imposed on an optical cavity, cell, or other optical element that holds gas due to the forces applied by the gas. The device
Created October 9, 2019, Updated June 15, 2021