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Search Patents by Jay H. Hendricks

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Deformometer for Determining Deformation of an Optical Cavity Optic

NIST Inventors
Zeeshan Ahmed, Kevin O Douglass, Stephen Eckel, Patrick Egan and Jay H. Hendricks
Patent Description NIST has developed a device that uses multiple wavelengths (colors) of light and/or multiple species of gas to independently measure the distortions imposed on an optical cavity, cell, or other optical element that holds gas due to the forces applied by the gas. The device