David G. Seiler (Fed)

David Seiler is a Senior Advisor for Microelectronics at the National Institute of Standards and Technology (NIST) Office of Advanced Manufacturing (OAM). 

Prior to joining OAM, David had over 20 years of experience as Chief of the Semiconductor Electronics and Engineering Physics Divisions at NIST, working with industry to provide innovative measurement science research and standards for dimensional, nanometer-scale, surface, and acoustic pressure measurements; semiconductors; microelectromechanical systems (MEMS); power electronics; nanoelectronics; smart grid; and flexible and printed electronics. He is a Fellow of the American Physical Society and the Institute of Electrical and Electronic Engineers (IEEE).

Dave’s involvement in the development of the semiconductor community includes contributing to the National Technology Roadmap for Semiconductors (NTRS) in 1991, 1994, and 1997, as well as the International Technology Roadmap for Semiconductors (ITRS) in 1999 and subsequent years.  He was a member of International SEMATECH's Analytical Lab Managers Working Group.  At NIST, he led two industrial surveys on characterization measurements for HgCdTe and optical characterization methods for the semiconductor industry.  He has also served on the IEEE Electron Device Society's Semiconductor Manufacturing Committee, the IEEE's Corporate Innovation Award Committee, and the Governing Council of the Nanoelectronics Research Initiative (a model for industry-driven consortia seeking a new paradigm beyond CMOS devices). Dave has also contributed to numerous evaluation and reviewer panels for state and U.S. government programs.

Dave has authored more than 140 invited and contributed papers and given over 200 talks at national and international meetings. In addition, he has been Chairperson and Proceedings Editor of 15 International Conferences or Workshops: Hot Electrons in Semiconductors, Narrow Gap Semiconductors, HgCdTe Characterization International Workshop, and the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, a series he initiated to address the measurement needs of the semiconductor industry. He is a co-author of the chapter "Optical Properties of Semiconductors" in the McGraw Hill Handbook of Optics (1995, revised in 2009). Most recently (2017), he co-edited a comprehensive book titled Metrology and Diagnostics Techniques for Nanoelectronics with Intel VP Zhiyong Ma.

Prior to joining NIST in 1988, Dr. Seiler served as a Solid-State Physics Program Director in the Materials Research Division at the National Science Foundation, spent a year's sabbatical at the MIT Francis Bitter National Magnet Laboratory, and had been a Regents Professor of Physics at the University of North Texas. 

As Senior Advisor for Microelectronics, Dave provides technical guidance on the formation of extramural research and development programs to support U.S. semiconductor manufacturing.