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Search Patents

Displaying 1 - 12 of 12
Patent description for Critical-Dimension Localization Microscopy

Apparatus for Critical-Dimension Localization Microscopy

NIST Inventors
Samuel M. Stavis and Craig Copeland
Performing critical-dimension localization microscopy includes: subjecting a first dimensional member and a second dimensional member of a reference artifact to critical-dimension metrology, the first and second dimensional members, in combination, including a critical dimension and each

Electron Paramagnetic Resonance Dosimeter, Methods of Manufacture, and Methods of Use

NIST Inventors
Laurence C. Chow and Shozo Takagi
An electron paramagnetic resonance device includes a crystalline, emission-sensitive mass and a housing containing the device. The mass includes structurally incorporated carbonate content in a range of about 3% by weight to about 10% by weight of the mass, one or more structurally incorporated non

Optical Phantom for Producing a Time-Resolved Diffuse Reflectance Spectrum

NIST Inventors
Jeeseong C. Hwang
An optical phantom produces a time-resolved diffuse reflectance spectrum and includes: a light source; a spatial light modulator; and an optical delay line including optical fibers of different length that produce different time-of-flight distributions, such that different time-of-flight
The figure shows a microfabricated optical probe with the following components: 110 - optical loop, 111 – structured region of 110, 114 – optical waveguide, 116 – first arm of optical waveguide, 120 – substrate, 122 – optical cladding layer, 124 – first single mode optical fiber, 126 – primary light, and 128 – output light.

Microfabricated Optical Probe

NIST Inventors
Vladimir Aksyuk and Kartik Srinivasan
Integrated photonics research and manufacturing requires a probe for in-line nondestructive optical testing of devices. Current optical probes require dedicated and large coupling areas in the photonic circuit, cannot provide sufficient control over the degree, location and direction of optical

Photonic probe for atomic force microscopy

NIST Inventors
Marcelo Davanco and Vladimir Aksyuk
A photonic probe for atomic force microscopy includes: a cantilever including: a tip; a wing in mechanical communication with the tip; an extension interposed between the tip and the wing to synchronously communicate motion of the tip with the wing; an optical resonator disposed proximate to the
This is a line drawing for patent number 10,625,470

3D Printing of Composition-Controlled Copolymers

NIST Inventors
Young Jong Lee
A computer-controlled method for forming a composition-controlled product using 3D printing includes disposing two or more liquid reactant compositions in respective two or more reservoirs; and mixing the two or more liquid reactant compositions, which in turn includes controlling by the computer a
Line drawing of high efficiency photon detection

High Efficiency Photon Detection

NIST Inventors
Alex Smolyanitsky
A detection pixel includes a material that is chosen so that its (averaged) atomic number density leads to the Compton process being the dominant scattering mechanism in response to incident photons, leading to production of Compton electrons with sufficient number and kinetic energy to produce an

Coinage Cladding Alloy and Processing for Making Coinage Cladding Alloy

NIST Inventors
Mark R. Stoudt and Carelyn E. Campbell
A coinage cladding alloy for coinage includes nickel present in an amount from 5 wt. % to 7 wt. %, based on a total weight of the coinage cladding alloy; zinc present in an amount from 21 wt. % to 29 wt. %, based on the total weight of the coinage cladding alloy; manganese present in an amount from

Ambient Temperature Superionic Conducting Salt Including Metal Cation and Borate Anion or Carborate Anion and Process for Making Ambient Temperature Superionic Conducting Salt

NIST Inventors
Terrence J Udovic
A process for making a superionic conducting salt includes: combining a primary salt and an impact member, the primary salt including an ordered phase and being an ionic conductor; impacting the primary salt with the impact member; and converting the primary salt to the superionic conducting salt in

Electron Paramagnetic Resonance Dosimeter, Methods of Manufacture, and Methods of Use

NIST Inventors
Laurence C. Chow and Shozo Takagi
A dosimeter for EPR dosimetry systems includes a carbonated hydroxyapatite cement formed by mixing a cement powder and a cement liquid in a ratio of a range of about 0.5 to 5.0 powder-to-liquid ratio. The cement powder includes one or more calcium phosphate compounds and one or more carbonate
Displaying 1 - 12 of 12