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Search Patents

Displaying 1 - 12 of 12
Patent description for Critical-Dimension Localization Microscopy

Apparatus for Critical-Dimension Localization Microscopy

NIST Inventors
Samuel M. Stavis and Craig Copeland
Patent Description Critical-Dimension Localization Microscopy (CDLM) is a new calibration and measurement method that establishes SI-traceability of optical microscopy and enables subnanometer localization accuracy over a submillimeter field. NIST fabricated arrays of sub-resolution apertures in an

Electron Paramagnetic Resonance Dosimeter, Methods of Manufacture, and Methods of Use

NIST Inventors
Laurence C. Chow and Shozo Takagi
Patent Description Certain materials, when exposed to ionizing radiation, can be stimulated to emit a measurable signal that may be used to estimate the received radiation dose. Certain of these materials may be incorporated into a dosimeter that is worn or carried by an individual to measure the

Optical Phantom for Producing a Time-Resolved Diffuse Reflectance Spectrum

NIST Inventors
Jeeseong C. Hwang
Patent Description Physikalisch-Technische Bundesanstalt (PTB) and NIST jointly developed a concept for a waveform synthesizer which can generate a controlled waveform with several picosecond (ps) time resolution. In a light-diffusing material, characteristics of the time-of-flight distribution (e.g
The figure shows a microfabricated optical probe with the following components: 110 - optical loop, 111 – structured region of 110, 114 – optical waveguide, 116 – first arm of optical waveguide, 120 – substrate, 122 – optical cladding layer, 124 – first single mode optical fiber, 126 – primary light, and 128 – output light.

Microfabricated Optical Probe

NIST Inventors
Vladimir Aksyuk and Kartik Srinivasan
Patent Description Integrated photonics research and manufacturing requires a probe for in-line nondestructive optical testing of devices. Current optical probes require dedicated and large coupling areas in the photonic circuit. They cannot provide sufficient control over the degree, location and

Photonic probe for atomic force microscopy

NIST Inventors
Marcelo Davanco and Vladimir Aksyuk
Patent Description Atomic force microscopy probes with integrated photonic optomechanical cavity readout are new and provide improved sensitivity, increased measurement speed and reduced measurement noise in a variety of research and manufacturing metrology applications. While such probes have been
This is a line drawing for patent number 10,625,470

3D Printing of Composition-Controlled Copolymers

NIST Inventors
Young Jong Lee
Patent Description This invention is a new 3D printing process of continuously or discretely controlling composition of photo-polymerization reactants to produce 3D objects with spatially varying chemical, physical and mechanical properties. This invention is based on photo­ polymerization of liquid
Line drawing of high efficiency photon detection

High Efficiency Photon Detection

NIST Inventors
Alex Smolyanitsky
Patent Description A detection pixel includes a material that is chosen so that its (averaged) atomic number density leads to the Compton process being the dominant scattering mechanism in response to incident photons, leading to production of Compton electrons with sufficient number and kinetic

Coinage Cladding Alloy and Processing for Making Coinage Cladding Alloy

NIST Inventors
Mark R. Stoudt and Carelyn E. Campbell
Patent Description The US Mint charged NIST with more cost effect 5 and 25 cents coins. Currently, commercial cupronickel C71300 alloy is not cost effective to produce 5 cent coins. C77000 is a commercial ternary alloy of Cu, Ni, and Zn possessing similar properties of C71300 but cost approximately

Ambient Temperature Superionic Conducting Salt Including Metal Cation and Borate Anion or Carborate Anion and Process for Making Ambient Temperature Superionic Conducting Salt

NIST Inventors
Terrence J Udovic
Patent Description Today’s batteries contain flammable, toxic, liquid electrolytes. Therefore, safer all-solid-state batteries are a current research goal. This requires solid-electrolyte materials with high ionic mobilities, high chemical and electrochemical stabilities, and good formability. The

Electron Paramagnetic Resonance Dosimeter, Methods of Manufacture, and Methods of Use

NIST Inventors
Laurence C. Chow and Shozo Takagi
Patent Description Certain materials, when exposed to ionizing radiation, can be stimulated to emit a measurable signal that may be used to estimate the received radiation dose. Certain of these materials may be incorporated into a dosimeter that is worn or carried by an individual to measure the
Displaying 1 - 12 of 12