NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Linearity and resolution of refracted near-field scanning technique

Published

Author(s)

M. Young

Abstract

Refracted near-field scanning is an attractive method for precisely determining the index profile of an optical waveguide. This method was first proposed and demonstrated by Stewart and later refined by White. In an earlier paper, I analyzed the linearity and precision of the method; this paper additionally discusses resolution and related areas.
Citation
NIST Interagency/Internal Report (NISTIR) -
NIST Pub Series
NIST Interagency/Internal Report (NISTIR)
Pub Type
NIST Pubs

Download Paper

Local Download

Citation

Young, M. (1980), Linearity and resolution of refracted near-field scanning technique, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=11400 (Accessed October 10, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created October 1, 1980, Updated February 17, 2017
Was this page helpful?