Chandler-Horowitz, D.
, Marchiando, J.
, Doss, M.
, Krause, S.
and Visitserngtrakul, S.
(1990),
Sensitivity of Ellipsometric Modeling to the, Technical Abstracts of the 1990 IEEE SOS/SOI Technology Conference, Key West, FL, USA (Accessed May 2, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Sensitivity of Ellipsometric Modeling to the
Published
Author(s)
, , M. G. Doss, S. J. Krause, S. Visitserngtrakul
Proceedings Title
Technical Abstracts of the 1990 IEEE SOS/SOI Technology Conference
Conference Dates
October 2-4, 1990
Conference Location
Key West, FL, USA
Conference Title
1990 IEEE SOS/SOI Technology Conference
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created October 30, 1990, Updated October 12, 2021