Permittivity Measurements of High Dielectric Constant Films at Microwave Frequencies

Published

April 1, 2000

Author(s)

Jan Obrzut, R Nozaki

Abstract

We have developed a time-domain reflectometry (TDR) technique to measure the dielectric permittivity of high dielectric constant films. The test specimen consists of a planar capacitor terminating coaxial waveguide. The complex permittivity of the dielectric in the frequency domain is obtained from appropriate analysis of the incident and the reflected voltage waves. In order to improve accuracy at higher frequencies, a working equation is delivered to account for propagation in the specimen section. The applicability of the method has been verified at frequencies from 100 MHz to 10 GHz on several polymer composite films 40 mm to 100 mm thick having a dielectric constant ranging from 4 to 40. The results obtained in the broad frequency range by using the TDR technique were compared with those obtained from the gap-coupled microstrip resonators at discrete frequencies.

Proceedings Title

Printed Circuits, Technical Conference | | | IPC

Volume

73(5)

Conference Dates

April 1, 2000

Conference Location

San Diego, CA

Conference Title

IPC Printed Circuits Expo

Pub Type

Conferences

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Keywords

dielectric films, microwe, permittivity, TDR

Citation

Obrzut, J. and Nozaki, R. (2000), Permittivity Measurements of High Dielectric Constant Films at Microwave Frequencies, Printed Circuits, Technical Conference | | | IPC, San Diego, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851686 (Accessed October 13, 2025)