TY  - CONF
AU  - Jan Obrzut
AU  - R Nozaki
C2  - Printed Circuits, Technical Conference | | | IPC,  San Diego, CA
DA  - 2000-04-01
LA  - en
M1  - 73(5)
PB  - Printed Circuits, Technical Conference | | | IPC,  San Diego, CA
PY  - 2000
TI  - Permittivity Measurements of High Dielectric Constant Films at Microwave Frequencies
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851686
ER  -