Snyder, C.
, Looney, J.
and Casassa, M.
(2002),
Survey of FY 2001 Nanotechnology-Related Research at the National Institute of Standards and Technology., NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.6864
(Accessed October 6, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Survey of FY 2001 Nanotechnology-Related Research at the National Institute of Standards and Technology.
Published
Author(s)
, ,
Citation
NIST Interagency/Internal Report (NISTIR) - 6864
Report Number
6864
NIST Pub Series
Pub Type
NIST Pubs
Download Paper
Keywords
Dielectric Properties, Electronic Materials, Filled Polymers, Lithography, Mechanical Properties, Microscopy, Multiphase Materials, Nanostructured Materials, National Nanotechnology Initiative, Simulations & Modeling, Thin Films, nanotechnology
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created January 1, 2002, Updated November 10, 2018