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PUBLICATIONS

Hardness Assurance Testing of Bipolar Junction Transistors at Elevated Irradiation Temperatures

Published

Author(s)

S C. Witczak, R D. Schrimpf, D M. Fleetwood, K F. Galloway, R C. Lacoe, D C. Mayer, James M. Puhl, R L. Pease, John S. Suehle
Citation
IEEE Transactions on Nuclear Science
Volume
44
Issue
6
Pub Type
Journals

Citation

Witczak, S. , Schrimpf, R. , Fleetwood, D. , Galloway, K. , Lacoe, R. , Mayer, D. , Puhl, J. , Pease, R. and Suehle, J. (1997), Hardness Assurance Testing of Bipolar Junction Transistors at Elevated Irradiation Temperatures, IEEE Transactions on Nuclear Science (Accessed October 20, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 31, 1996, Updated October 12, 2021
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