@article{798851,
  author = {S Witczak and R Schrimpf and D Fleetwood and K Galloway and R Lacoe and D Mayer and James Puhl and R Pease and John Suehle},
  title = {Hardness Assurance Testing of Bipolar Junction Transistors at Elevated Irradiation Temperatures},
  year = {1997},
  number = {44},
  month = {1997-01-01 00:01:00},
  publisher = {IEEE Transactions on Nuclear Science},
  language = {en},
}