Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Hall Effect Measurements Algorithm

The sheet resistance RS can be obtained from the two measured characteristic resistances RA and RB by numerically solving the van der Pauw equation [Eq. (3) in the text] by iteration

exp(-π RA/RS) + exp(-π RB/RS) = 1

as outlined in the following routine:

Hall Effect Measurements Algorithm

Notice of Online Archive: This page is no longer being updated and remains online for informational and historical purposes only.

Contacts

Created April 15, 2010, Updated July 19, 2022
Was this page helpful?