Dr Kenny Yu is a researcher in the Materials Measurement Science Division, Material Measurement Laboratory, NIST, Gaithersburg. His research background is in thermal transport, specifically in thermoreflectance techniques, interfacial phonon transport theories, and device fabrication/process integration. He is currently involved in the Transport Property Measurements for Semiconductors and Energy Materials project.
Professional Activities
- Active peer reviewer and poster judge for IEEE iTherm Conferences
Scholarship and Membership
- 2025-Present: Sigma Xi - NIST Chapter, Full Member
- 2020-2022: Irish Research Council Scholar (Enterprise Partnership Scheme - Nokia Bell Labs)
- 2018-2020: Irish Research Council Scholar (Employment-Based Programme - Nokia Bell Labs)
Selected Publications (prior to joining NIST)
- K. Yu, R. Enright and D. McCloskey, "Quantifying interfacial thermal conductance at solid-liquid interfaces using frequency-domain thermoreflectance and analytical methods," DOI: 10.1109/iTherm54085.2022.9899691.
- K. Yu, R. Enright and D. McCloskey, "Monte Carlo analysis of frequency domain thermoreflectance data for quantitative measurement of interfacial thermal conductance at solid-liquid interfaces modified with self-assembled monolayers," DOI: 10.1088/1742-6596/2116/1/012042
- S. Corbett, D. Gautam, S. Lal, K. Yu, N. Balla, G. Cunningham, K. M. Razeeb, R. Enright, and D. McCloskey, "Electrodeposited Thin-Film Micro-Thermoelectric Coolers with Extreme Heat Flux Handling and Microsecond Time Response," DOI: 10.1021/acsami.0c16614