Ritchie, N.
(2001),
Embracing Uncertainty: Modeling Uncertainty in EPMA - Part II, Microscopy and Microanalysis, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=930079
(Accessed April 30, 2024)
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Embracing Uncertainty: Modeling Uncertainty in EPMA - Part II
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Abstract
This, the second in a series of articles present a new framework for considering the computation of uncertainty in electron excited X-ray microanalysis measurements, will discuss matrix correction. The framework presented in the first article will be applied to the matrix correction model called ''Pouchou and Pichoir's Simplified Model'' or simply ''XPP''. This uncertainty calculation will consider the influence of beam energy, take-off angle, mass- absorption coefficient, surface roughness and other parameters. Since uncertainty calculations and measurement optimization are so intimately related, it also provides a starting point for optimizing accuracy through choice of measurement design.Citation
Microscopy and Microanalysis
Pub Type
Journals
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Keywords
matrix correction, uncertainty, microanalysis, electron probe microanalysis, energy dispersive x-ray spectrometry, wavelength dispersive x-ray spectrometry
Citation
Created January 1, 2001, Updated August 26, 2022