Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Nathan Nakamura (Fed)

Nathan Nakamura is a physicist in the Quantum Sensors Group at NIST. His research interests include the use of superconducting x-ray microcalorimeters for applications such as computed tomography and x-ray spectroscopy and the application of Monte Carlo approaches to model superconducting x-ray sensors and associated instrumentation. He joined NIST in 2020 as a National Research Council (NRC) postdoctoral fellow.

Publications

Spectroscopic Measurements and Models of Energy Deposition in the Substrate of Quantum Circuits by Natural Ionizing Radiation

Author(s)
Joseph Fowler, Paul Szypryt, Raymond Bunker, Ellen Edwards, Ian Fogarty Florang, JIANSONG GAO, Shannon Hoogerheide, Ben Loer, Hans Mumm, Nathan Nakamura, John Orrell, Elizabeth M. Scott, Jason Stevens, Daniel Swetz, Brent VanDevender, Michael Vissers, Joel Ullom
Naturally occurring background radiation is a potential source of correlated decoherence events in superconducting qubits that will challenge error-correction

Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer

Author(s)
Nathan Nakamura, Paul Szypryt, Amber Dagel, Bradley Alpert, Douglas Bennett, W.Bertrand (Randy) Doriese, Malcolm Durkin, Joseph Fowler, Dylan Fox, Johnathon Gard, Ryan Goodner, James Zachariah Harris, Gene C. Hilton, Edward Jimenez, Burke Kernen, Kurt Larson, Zachary H. Levine, Daniel McArthur, Kelsey Morgan, Galen O'Neil, Christine Pappas, Carl D. Reintsema, Dan Schmidt, Peter Schulz, Daniel Swetz, Kyle Thompson, Joel Ullom, Leila R. Vale, Courtenay Vaughan, Christopher Walker, Joel Weber, Jason Wheeler
X-ray nanotomography is a powerful tool for the characterization of nanoscale materials and structures, but it is difficult to implement due to the competing
Created September 2, 2020, Updated October 11, 2023
Was this page helpful?