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Luis Miaja Avila (Fed)

Publications

Wavelength-Dependent Field Ion Emission in Atom Probe Tomography

Author(s)
Ann Debay, Benjamin Caplins, Karen DeRocher, Jacob Garcia, May Martin, Mark McLean, Christopher Mead, Luis Miaja Avila, William Osborn, Xiaochen Ren, Norman Sanford
Laser-pulsed atom probe tomography (APT) is a powerful tool for materials characterization due to its desirable combination of high spatial resolution and...
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Patents (2018-Present)

Dynamic Multi-Wavelength and Sample Voltage Atom Probe Tomograph Feedback Control System

NIST Inventors
Ann Chiaramonti Debay , Norman A. Sanford , Luis Miaja Avila and Benjamin Caplins
This invention is a high-precision atomic-scale analysis system designed to map the atomic-scale chemical structure of materials with improved accuracy and precision. By integrating a multi-wavelength pulsed radiation source with a high-voltage power supply, the system identifies and locates
X-Ray Spectrometer

X-Ray Spectrometer

NIST Inventors
Kevin L. Silverman , Carl D. Reintsema , Luis Miaja Avila , Daniel Swetz , W.Bertrand (Randy) Doriese , Dan Schmidt , Bradley Alpert , Joseph Fowler , Joel Ullom and Ralph Jimenez
This invention includes: an x-ray plasma source that produces primary x-rays; an x-ray optic that transmits and focuses the primary x-ray onto a sample jet from which fluorescence x-ray are emitted; and a microcalorimeter array detector that measures the energy of the incoming fluorescence x-rays
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Created April 7, 2019, Updated December 8, 2022
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