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Sergiy Krylyuk (Fed)

Material Researcher Engineer

Dr. Krylyuk is a member of the Functional Nanostructured Materials Group in the Materials Science and Engineering Division at National Institute of Standards and Technology (NIST). He earned his PhD degree in Physics from Chernivtsi National University (Chernivtsi, Ukraine) in 1999 and worked in the Institute of Semiconductor Physics, National Academy of Sciences of Ukraine (Kyiv, Ukraine). Dr. Krylyuk joined NIST in 2005 to work on developing capabilities for fabrication of Si and GaN nanowires using Chemical Vapor Deposition method. His current research focuses on the development of Chemical Vapor Transport and Bridgman-Stockbarger methods to grow a variety of 2D materials with defined and tunable composition, electronic, magnetic and optical properties, including MoTe2, WSe2, WTe2, InSe, In2Se3, etc. Dr. Krylyuk coauthored 90+ research papers and one US Patent.

Publications

Quantum Monte Carlo and density functional theory study of strain and magnetism in 2D 1T-VSe2 with charge density wave states

Author(s)
Daniel Wines, Akram Ibrahim, Nishwanth Gudibandla, Tehseen Adel, Frank Abel, Sharadh Jois, Kayahan Saritas, Jaron Krogel, Li Yin, Tom Berlijn, Aubrey Hanbicki, Gregory Stephen, Adam Friedman, Sergiy Krylyuk, Albert Davydov, Brian Donovan, Michelle Jamer, Angela Hight Walker, Kamal Choudhary, Francesca Tavazza, Can Ataca
Two-dimensional (2D) 1T-VSe2 has prompted significant interest due to the discrepancies regarding alleged ferromagnetism (FM) at room temperature, charge

Quantum Emitters Induced by High Pressure and UV Laser Irradiation in Multilayer GaSe

Author(s)
Sinto Varghese, Sichenge Wang, Bimal Neupane, Bhojraj Bhandari, Yan Jiang, Roberto Gonzalez Rodriguez, Sergiy Krylyuk, Albert Davydov, Hao Yan, Yuanxi Wang, Anupama Kaul, Jingbiao Cui, Yuankun Lin
In this work, we report on defect generation in multilayer GaSe through hydrostatic pressure quenching and UV laser irradiation. The Raman line width from the

Patents (2018-Present)

Phase Transition Based Resistive Random-Access Memory

NIST Inventors
Albert Davydov , Sergiy Krylyuk and Huairuo Zhang
A method of switching a phase-change device (Device), including changing phase of the Device from a semiconducting 2H phase to a new 2H d phase with a higher conductivity, the Device having an active material with a thickness including a phase transition material to thereby transition the Device
Created September 24, 2019, Updated December 8, 2022
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