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Martin Sohn (Fed)
Physicist
Dr. Sohn is a physicist in the Nanoscale Spectroscopy Group at the National Institute of Standards and Technology (NIST). He is leading an effort in the development of Computational Nanostructure Imaging Program for dimensional characterization of semiconductor devices by harnessing deep ultraviolet (DUV) and extreme ultraviolet (EUV) light to obtain 3-dimensional reconstruction and developing advanced quantitative image reconstruction algorithms at the deep-subwavelength scales. The research scope includes nanoscale dimensional measurement sensitivity analysis, phase imaging for nanoscale defect detection, 3-dimensional reconstruction of nanoscale structures, angle scanning illumination, super-resolution imaging, and ptychographic image reconstruction. He is developing Quantum Imaging Program that aims to elucidate various quantum/classical phenomena by imaging quantum states multi-dimensionally using single photons entangled and structured. The research explores quantum phenomena in photon-photon interference and photon-matter interaction, covering nanosecond-gated single photon imaging, single photon interferences, phase analysis at single photon level, biphoton entanglement, orbital angular momentum at high dimensions, quantum harmonic oscillation in trapped particles. Dr. Sohn contributed numerous technical papers, gave talks at international conferences, and holds 3 US patents. Dr. Sohn served 2024 IEEE Conference on Computation Imaging using Synthetic Aperture as the optics track cochair and has been serving the Optical and EUV Nanolithography conference of the SPIE Advanced Lithography and Patterning as a technical committee member.
If you are interested in Dr. Sohn's research areas and seeking a postdoctoral position, martin.sohn [at] nist.gov (please contact Dr. Sohn) to discuss in more detail the opportunities available to join one of the projects, or visit to NRC Research Associate Programs searching the research opportunity titled "EUV Computational Imaging for Nanostructure Characterization."