Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Journal of Research of NIST Volume 124

Volume 124 (2019)

ISSN: 2165-7254
Journal of Research of NIST Article Types


Laboratory Information Management Systems for Electron Microscopy: Evaluation of the 4CeeD Data Curation Platform
June W. Lau, Rachel F. Devers, Marcus Newrock, Gretchen Greene
Published December 17, 2019

Practical Guide to the Design, Fabrication, and Calibration of NIST Nanocalorimeters
Feng Yi, Michael D. Grapes, David A. LaVan
Published December 16, 2019

Dielectric Properties of NbxW1-xSe2 Alloys
Albert F. Rigosi, Heather M. Hill, Sergiy Krylyuk, Nhan V. Nguyen, Angela R. Hight Walker, Albert V. Davydov, David B. Newell
Published December 16, 2019

Tabular Potentials for Monte Carlo Simulation of Supertoroids with Short-Range Interactions
Harold W. Hatch, Gordon W. McCann
Published December 4, 2019

Forced Edges and Graph Structure
Brian Cloteaux
Published November 19, 2019

Influence of Isotopologue Dipole Moments on Precision Dielectric-Constant Measurements
Allan H. Harvey
Published November 4, 2019

Optical-Fiber Power Meter Comparison between NIST and LAMETRO
I. Vayshenker, J. Jimenez, M. P. Ugalde, J. H. Lehman
Published November 1, 2019

A Purely Algebraic Justification of the Kabsch-Umeyama Algorithm
Jim Lawrence, Javier Bernal, Christoph Witzgall
Published October 9, 2019

The Use of Correlated Binomial Distribution in Estimating Error Rates for Firearm Evidence Identification
Nien Fan Zhang
Published October 2, 2019

A Century of WWV
Glenn K. Nelson
Published September 24, 2019

Improving Reproducibility in Research: The Role of Measurement Science
Robert J. Hanisch, Ian S. Gilmore, Anne L. Plant
Published September 18, 2019

Stress Measurements in Alumina by Optical Fluorescence: Revisited
Robert F. Cook, Chris A. Michaels
Published August 27, 2019

Background and Review of Cavity-Enhanced Spontaneous Parametric Down-Conversion
Oliver Slattery, Lijun Ma, Kevin Zong, Xiao Tang
Published August 22, 2019

X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors
Bala Muralikrishnan, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, Felix Kim
Published July 11, 2019

X-ray Computed Tomography Instrument Performance Evaluation, Part I: Sensitivity to Detector Geometry Errors
Bala Muralikrishnan, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, Felix Kim
Published July 11, 2019

Detailed Derivations of Formulas for Heat Release Rate Calculations Revisited: A Pedagogical and Systematic Approach
Jiann C. Yang
Published June 24, 2019

Scatter Corrections in X-Ray Computed Tomography: A Physics-Based Analysis
Zachary H. Levine, Timothy J. Blattner, Adele P. Peskin, Adam L. Pintar
Published May 22, 2019

Comparison of Models for Heat Transfer in High-Density Fibrous Insulation
Sergio A. Carvajal, Edward J. Garboczi, Robert R. Zarr
Published May 13, 2019

Fatigue Testing of Pipeline Welds and Heat-Affected Zones in Pressurized Hydrogen Gas
Elizabeth S. Drexler, Andrew J. Slifka, Robert L. Amaro, Jeffrey W. Sowards, Matthew J. Connolly, May L. Martin, Damian S. Lauria
Published April 26, 2019

Apparatus for Characterizing Gas-Phase Chemical Precursor Delivery for Thin Film Deposition Processes
James E. Maslar, William A. Kimes, Brent A. Sperling
Published March 26, 2019

A Black-Box Noninvasive Characterization Method for Industrial Wireless Networks
Mohamed Kashef, Richard Candell, Kang Lee
Published March 18, 2019

Viscosity Measurements of Three Base Oils and One Fully Formulated Lubricant and New Viscosity Correlations for the Calibration Liquid Squalane
Arno Laesecke, Clemens Junker, Damian S. Lauria
Published February 13, 2019

Proceedings of the First Workshop on Standards for Microfluidics
Darwin R. Reyes and Henne van Heeren
Published January 28, 2019


Ⓓ RF Dataset of Incumbent Radar Signals in the 3.5 GHz CBRS Band
Raied Caromi, Michael Souryal, Timothy A. Hall
Published December 17, 2019

Ⓓ Process Monitoring Dataset from the Additive Manufacturing Metrology Testbed (AMMT): “Three-Dimensional Scan Strategies”
Brandon Lane, Ho Yeung
Published November 19, 2019

Ⓓ Variation of Surface Topography in Laser Powder Bed Fusion Additive Manufacturing of Nickel Super Alloy 625
Jason C. Fox
Published September 10, 2019

Ⓓ A Reference Schema for the Unit Manufacturing Process Information Model
William Z. Bernstein and David Lechevalier
Published May 7, 2019

Ⓓ Hydrogen-Deuterium Exchange Mass Spectrometry (HDX-MS) Centroid Data Measured between 3.6 °C and 25.4 °C for the Fab Fragment of NISTmAb
Jeffrey W. Hudgens, Elyssia S. Gallagher, Ioannis Karageorgos, Kyle W. Anderson, Richard Y.-C. Huang, Guodong Chen, George M. Bou-Assaf, Alfonso Espada, Michael J. Chalmers, Eduardo Harguindey, Hui-Min Zhang, Benjamin T. Walters, Jennifer Zhang, John Venable, Caitlin Steckler, Inhee Park, Ansgar Brock, Xiaojun Lu, Ratnesh Pandey, Arun Chandramohan, Ganesh Srinivasan Anand, Sasidhar N. Nirudodhi, Justin B. Sperry, Jason C. Rouse,James A. Carroll, Kasper D. Rand, Ulrike Leurs, David D. Weis, Mohammed A. Al-Naqshabandi, Tyler S. Hageman, Daniel Deredge, Patrick L. Wintrode, Malvina Papanastasiou, John D. Lambris, Sheng Li, Sarah Urata
Published May 2, 2019

Ⓓ Design, Manufacturing, and Inspection Data for a Three-Component Assembly
Thomas D. Hedberg, Jr., Michael E. Sharp, Toby M. M. Maw, Mostafizur M. Rahman, Swati Jadhav, James J. Whicker, Allison Barnard Feeney, Moneer Helu
Published February 12, 2019

Ⓓ X-ray Metrology for the Semiconductor Industry Tutorial
Daniel F. Sunday, Wen-li Wu, Scott Barton, R. Joseph Kline
Published February 1, 2019


Ⓢ Software to Report Product and Manufacturing Information in QIF Files
Robert R. Lipman
Published December 4, 2019

Ⓢ Nestor: A Tool for Natural Language Annotation of Short Texts
Rachael Sexton, Michael P. Brundage
Published November 1, 2019

Ⓢ Translator from Extended SysML to Physical Interaction and Signal Flow Simulation Platforms
Raphael Barbau, Conrad Bock, Mehdi Dadfarnia
Published July 2, 2019

Ⓢ pyMCR: A Python Library for Multivariate Curve Resolution Analysis with Alternating Regression (MCR-AR)
Charles H. Camp Jr.
Published June 24, 2019

Ⓢ pyLLE: A Fast and User Friendly Lugiato-Lefever Equation Solver
Gregory Moille, Qing Li, Xiyuan Lu, Kartik Srinivasan
Published May 24, 2019

Ⓢ interlab: A Python Module for Analyzing Interlaboratory Comparison Data
David A. Sheen
Published March 15, 2019


Lane C. Sander
Published October 2, 2019

Created January 16, 2020, Updated January 2, 2024