Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

NIST Research on the International System of Units

Description of New Article Types

Historical Volumes in NIST Digital Archives

The Journal of Research of NIST publishes peer-reviewed research articles, in addition to dataset and software articles, tutorials, and tech transfer briefs. Articles are indexed by all major indexing services, including Web of Science and Scopus.

Instructions for Authors

Manuscripts are accepted by email from NIST staff only. Instructions for authors are available on the NIST internal site.

Volume 124 (2019)

ISSN: 2165-7254

Research

A Purely Algebraic Justification of the Kabsch-Umeyama Algorithm
Jim Lawrence, Javier Bernal, Christoph Witzgall
https://doi.org/10.6028/jres.124.028
Published October 9, 2019

The Use of Correlated Binomial Distribution in Estimating Error Rates for Firearm Evidence Identification
Nien Fan Zhang
https://doi.org/10.6028/jres.124.026
Published October 2, 2019

A Century of WWV
Glenn K. Nelson
https://doi.org/10.6028/jres.124.025
Published September 24, 2019

Improving Reproducibility in Research: The Role of Measurement Science
Robert J. Hanisch, Ian S. Gilmore, Anne L. Plant
https://doi.org/10.6028/jres.124.024
Published September 18, 2019

Stress Measurements in Alumina by Optical Fluorescence: Revisited
Robert F. Cook, Chris A. Michaels
https://doi.org/10.6028/jres.124.020
Published August 27, 2019

Background and Review of Cavity-Enhanced Spontaneous Parametric Down-Conversion
Oliver Slattery, Lijun Ma, Kevin Zong, Xiao Tang
https://doi.org/10.6028/jres.124.019
Published August 22, 2019

X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors
Bala Muralikrishnan, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, Felix Kim
https://doi.org/10.6028/jres.124.015
Published July 11, 2019

X-ray Computed Tomography Instrument Performance Evaluation, Part I: Sensitivity to Detector Geometry Errors
Bala Muralikrishnan, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, Felix Kim
https://doi.org/10.6028/jres.124.014
Published July 11, 2019

Detailed Derivations of Formulas for Heat Release Rate Calculations Revisited: A Pedagogical and Systematic Approach
Jiann C. Yang
https://doi.org/10.6028/jres.124.016
Published June 24, 2019

Scatter Corrections in X-Ray Computed Tomography: A Physics-Based Analysis
Zachary H. Levine, Timothy J. Blattner, Adele P. Peskin, Adam L. Pintar
https://doi.org/10.6028/jres.124.013
Published May 22, 2019

Comparison of Models for Heat Transfer in High-Density Fibrous Insulation
Sergio A. Carvajal, Edward J. Garboczi, Robert R. Zarr
https://doi.org/10.6028/jres.124.010
Published May 13, 2019

Fatigue Testing of Pipeline Welds and Heat-Affected Zones in Pressurized Hydrogen Gas
Elizabeth S. Drexler, Andrew J. Slifka, Robert L. Amaro, Jeffrey W. Sowards, Matthew J. Connolly, May L. Martin, Damian S. Lauria
https://doi.org/10.6028/jres.124.008
Published April 26, 2019

Apparatus for Characterizing Gas-Phase Chemical Precursor Delivery for Thin Film Deposition Processes
James E. Maslar, William A. Kimes, Brent A. Sperling
https://doi.org/10.6028/jres.124.005
Published March 26, 2019

A Black-Box Noninvasive Characterization Method for Industrial Wireless Networks
Mohamed Kashef, Richard Candell, Kang Lee
https://doi.org/10.6028/jres.124.007
Published March 18, 2019

Viscosity Measurements of Three Base Oils and One Fully Formulated Lubricant and New Viscosity Correlations for the Calibration Liquid Squalane
Arno Laesecke, Clemens Junker, Damian S. Lauria
https://doi.org/10.6028/jres.124.002
Published February 13, 2019

Proceedings of the First Workshop on Standards for Microfluidics
Darwin R. Reyes and Henne van Heeren
https://doi.org/10.6028/jres.124.001
Published January 28, 2019

Dataset

Ⓓ Variation of Surface Topography in Laser Powder Bed Fusion Additive Manufacturing of Nickel Super Alloy 625
Jason C. Fox
https://doi.org/10.6028/jres.124.023
Published September 10, 2019
Data: https://doi.org/10.18434/M32020

Ⓓ A Reference Schema for the Unit Manufacturing Process Information Model
William Z. Bernstein and David Lechevalier
https://doi.org/10.6028/jres.124.011
Published May 7, 2019
Data: https://doi.org/10.18434/M32027

Ⓓ Hydrogen-Deuterium Exchange Mass Spectrometry (HDX-MS) Centroid Data Measured between 3.6 °C and 25.4 °C for the Fab Fragment of NISTmAb
Jeffrey W. Hudgens, Elyssia S. Gallagher, Ioannis Karageorgos, Kyle W. Anderson, Richard Y.-C. Huang, Guodong Chen, George M. Bou-Assaf, Alfonso Espada, Michael J. Chalmers, Eduardo Harguindey, Hui-Min Zhang, Benjamin T. Walters, Jennifer Zhang, John Venable, Caitlin Steckler, Inhee Park, Ansgar Brock, Xiaojun Lu, Ratnesh Pandey, Arun Chandramohan, Ganesh Srinivasan Anand, Sasidhar N. Nirudodhi, Justin B. Sperry, Jason C. Rouse,James A. Carroll, Kasper D. Rand, Ulrike Leurs, David D. Weis, Mohammed A. Al-Naqshabandi, Tyler S. Hageman, Daniel Deredge, Patrick L. Wintrode, Malvina Papanastasiou, John D. Lambris, Sheng Li, Sarah Urata
https://doi.org/10.6028/jres.124.009
Published May 2, 2019
Data: https://doi.org/10.18434/8SX3-NQ49

Ⓓ Design, Manufacturing, and Inspection Data for a Three-Component Assembly
Thomas D. Hedberg, Jr., Michael E. Sharp, Toby M. M. Maw, Mostafizur M. Rahman, Swati Jadhav, James J. Whicker, Allison Barnard Feeney, Moneer Helu
https://doi.org/10.6028/jres.124.004
Published February 12, 2019
Data: https://doi.org/10.18434/T4/1503154

Ⓓ X-ray Metrology for the Semiconductor Industry Tutorial
Daniel F. Sunday, Wen-li Wu, Scott Barton, R. Joseph Kline
https://doi.org/10.6028/jres.124.003
Published February 1, 2019
Videos: https://doi.org/10.18434/T4/1503330

Journal of Research of NIST

Instructions for Authors

Volume 124 (2019)

Research

Dataset

Software

Tutorial

Article Types