NIST Research Library

Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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The Journal of Research of NIST publishes peer-reviewed research articles, in addition to dataset and software articles, tutorials, and tech transfer briefs. Articles are indexed by all major indexing services, including Web of Science and Scopus.

Instructions for Authors

Manuscripts are accepted by email from NIST staff only. Instructions for authors are available on the NIST internal site. 

Volume 124 (2019)

ISSN: 2165-7254

Research

X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors
Bala Muralikrishnan, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, Felix Kim
https://doi.org/10.6028/jres.124.015
Published July 11, 2019

X-ray Computed Tomography Instrument Performance Evaluation, Part I: Sensitivity to Detector Geometry Errors​​​​​​​
Bala Muralikrishnan, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, Felix Kim
https://doi.org/10.6028/jres.124.014
Published July 11, 2019

Detailed Derivations of Formulas for Heat Release Rate Calculations Revisited: A Pedagogical and Systematic Approach
Jiann C. Yang
https://doi.org/10.6028/jres.124.016
Published June 24, 2019

Scatter Corrections in X-Ray Computed Tomography: A Physics-Based Analysis
Zachary H. Levine, Timothy J. Blattner, Adele P. Peskin, Adam L. Pintar
https://doi.org/10.6028/jres.124.013
Published May 22, 2019

Comparison of Models for Heat Transfer in High-Density Fibrous Insulation
Sergio A. Carvajal, Edward J. Garboczi, Robert R. Zarr
https://doi.org/10.6028/jres.124.010
Published May 13, 2019

Fatigue Testing of Pipeline Welds and Heat-Affected Zones in Pressurized Hydrogen Gas
Elizabeth S. Drexler, Andrew J. Slifka, Robert L. Amaro, Jeffrey W. Sowards, Matthew J. Connolly, May L. Martin, Damian S. Lauria
https://doi.org/10.6028/jres.124.008
Published April 26, 2019

Apparatus for Characterizing Gas-Phase Chemical Precursor Delivery for Thin Film Deposition Processes
James E. Maslar, William A. Kimes, Brent A. Sperling
https://doi.org/10.6028/jres.124.005
Published March 26, 2019

A Black-Box Noninvasive Characterization Method for Industrial Wireless Networks
Mohamed Kashef, Richard Candell, Kang Lee
https://doi.org/10.6028/jres.124.007
Published March 18, 2019

Viscosity Measurements of Three Base Oils and One Fully Formulated Lubricant and New Viscosity Correlations for the Calibration Liquid Squalane
Arno Laesecke, Clemens Junker, Damian S. Lauria
https://doi.org/10.6028/jres.124.002
Published February 13, 2019

Proceedings of the First Workshop on Standards for Microfluidics
Darwin R. Reyes and Henne van Heeren
https://doi.org/10.6028/jres.124.001
Published January 28, 2019

Dataset

Ⓓ A Reference Schema for the Unit Manufacturing Process Information Model
William Z. Bernstein and David Lechevalier
https://doi.org/10.6028/jres.124.011
Published May 7, 2019
Data: https://doi.org/10.18434/M32027

Ⓓ Hydrogen-Deuterium Exchange Mass Spectrometry (HDX-MS) Centroid Data Measured between 3.6 °C and 25.4 °C for the Fab Fragment of NISTmAb
Jeffrey W. Hudgens, Elyssia S. Gallagher, Ioannis Karageorgos, Kyle W. Anderson, Richard Y.-C. Huang, Guodong Chen, George M. Bou-Assaf, Alfonso Espada, Michael J. Chalmers, Eduardo Harguindey, Hui-Min Zhang, Benjamin T. Walters, Jennifer Zhang, John Venable, Caitlin Steckler, Inhee Park, Ansgar Brock, Xiaojun Lu, Ratnesh Pandey, Arun Chandramohan, Ganesh Srinivasan Anand, Sasidhar N. Nirudodhi, Justin B. Sperry, Jason C. Rouse,James A. Carroll, Kasper D. Rand, Ulrike Leurs, David D. Weis, Mohammed A. Al-Naqshabandi, Tyler S. Hageman, Daniel Deredge, Patrick L. Wintrode, Malvina Papanastasiou, John D. Lambris, Sheng Li, Sarah Urata
https://doi.org/10.6028/jres.124.009
Published May 2, 2019
Data: https://doi.org/10.18434/8SX3-NQ49

Ⓓ Design, Manufacturing, and Inspection Data for a Three-Component Assembly
Thomas D. Hedberg, Jr., Michael E. Sharp, Toby M. M. Maw, Mostafizur M. Rahman, Swati Jadhav, James J. Whicker, Allison Barnard Feeney, Moneer Helu
https://doi.org/10.6028/jres.124.004
Published February 12, 2019
Data: https://doi.org/10.18434/T4/1503154

Ⓓ X-ray Metrology for the Semiconductor Industry Tutorial
Daniel F. Sunday, Wen-li Wu, Scott Barton, R. Joseph Kline
https://doi.org/10.6028/jres.124.003
Published February 1, 2019
Videos: https://doi.org/10.18434/T4/1503330

Software

Ⓢ Translator from Extended SysML to Physical Interaction and Signal Flow Simulation Platforms
Raphael Barbau, Conrad Bock, Mehdi Dadfarnia
https://doi.org/10.6028/jres.124.017
Published July 2, 2019
Software: https://doi.org/10.18434/M32010

Ⓢ pyMCR: A Python Library for MultivariateCurve Resolution Analysis with Alternating Regression (MCR-AR)
Charles H. Camp Jr.
https://doi.org/10.6028/jres.124.018
Published June 24, 2019
Software: https://doi.org/10.18434/M32064

Ⓢ pyLLE: A Fast and User Friendly Lugiato-Lefever Equation Solver
Gregory Moille, Qing Li, Xiyuan Lu, Kartik Srinivasan
https://doi.org/10.6028/jres.124.012
Published May 24, 2019
Software: https://doi.org/10.18434/M32059

Ⓢ interlab: A Python Module for Analyzing Interlaboratory Comparison Data
David A. Sheen
https://doi.org/10.6028/jres.124.006
Published March 15, 2019
Software: https://doi.org/10.18434/t4/1503310

Article Types