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NIST Interagency/Internal Report (NISTIR)

Application Software Interface: ISDN Servies for an Open Systems Environment

February 1, 1995

Author(s)

D P. Stokesberry

An Evaluation of the Economic Impacts Associated with the NIST Power and Energy Calibration Services

January 1, 1995

Author(s)

Albert N. Link

Design, Specification and Tolerancing of Micrometer - Tolerance Assembles

January 1, 1995

Author(s)

Dennis A. Swyt

As increasing number of economically important products manufactured by U.S. companies are comprised of assemblies of macroscopic parts with microscopic...

Progress in Tip Modeling

January 1, 1995

Author(s)

John S. Villarrubia

Progress since the last Industrial Applications of Scanned Probe Microscopy workshop in the estimation of tip geometries for scanned probe microscopes is...

Validated Products List 1995 No. 1

January 1, 1995

Author(s)

Judy B. Kailey

A Study on Hazard Analysis in High Integrity Software Standards and Guidelines

January 1, 1995

Author(s)

L M. Ippolito, D Wallace

Proc. - Metrology Issues In Terahertz Physics and Technology,

January 1, 1995

Author(s)

Raju V. Datla, E Grossman, M K. And hobish

User's Guide for the ATS Version 2.0

January 1, 1995

Author(s)

David Rosenfeld

The Algorithm Testing System (ATS) is a software system which supports the Algorithm Testing & Evaluation Program: for Coordinate Measuring Systems (ATEP-CMS)...

Tables of X-Ray Mass Attenuation Coefficients and Mass Energy-Absorption Coefficients 1 keV to 20 MeV for Elements Z = 1 to 92 and 48 Additional Substances of Dosimetric Interest

January 1, 1995

Author(s)

J H. Hubbell, Stephen M. Seltzer

DETAN 95: Computer Code for Calculating Spectrum-Averaged Cross Sections and Detector Responses in Neutron Spectra

January 1, 1995

Author(s)

C M. Eisenhauer

SGML Parser Validation Procedures

January 1, 1995

Author(s)

R B. Wilson

Object-Oriented Technology Research Areas

January 1, 1995

Author(s)

Wayne J. Salamon, D Wallace

Expert Control System Shell Version 1.0 User

January 1, 1995

Author(s)

Steve Osella

The Expert Control System Shell (ECSS)is a software program running on a Macintosh computer which permits the rapid prototyping of control system architectures...

Automated Manufacturability Analysis: A Survey

January 1, 1995

Author(s)

William Regli

In the marketplace of the 21st century, there is no place for traditional over-the-wall'', communications between design and manufacturing. In order to design...

Product Models and Virtual Prototypes in Mechanical Engineering

January 1, 1995

Author(s)

Mike Pratt

This paper gives an overview of some of the modelling and virtual prototyping techniques used in product realization, with emphasis on the mechanical...

Overview of the Manufacturing Engineering Toolkit Prototype

January 1, 1995

Author(s)

Michael Iuliano

Many different types of manufacturing software applications have become available in recent years. These applications focus on specific engineering functions of...

Reference Manual for the Algorithm Testing System Version 2.0

January 1, 1995

Author(s)

David Rosenfeld

The Algorithm Testing System (ATS) is a software system which supports the Algorithm Testing and Evaluation Program for Coordinate Measuring Systems (ATEP-CMS)...

Extensions of the Prototype Application Protocol of Ready-to-wear Apparel Pattern Making

January 1, 1995

Author(s)

Yung-Tsun T. Lee

A prototype application protocol for ready-to-wear pattern making was developed for the communication of pattern pieces and related information between various...

Testing of Selected Self-Leveling Compounds for Floors

January 1, 1995

Author(s)

Chiara C. Ferraris

During the past year, a severe odor developed in some floors of a large office building. The odor has been attributed to interactions among a self-leveling...

Automated Manufacturing Research Facility: 1994 Annual Report

January 1, 1995

Author(s)

David C. Stieren, James S. Albus

Abstract not available.

Summary Report: Second Workshop in Industrial Applications of Scanned Probe Microscopy

January 1, 1995

Author(s)

John A. Dagata, A Diebold, C Shih, R Colton

The Second Workshop on Industrial Applications of Scanned Probe Microscopy (IASPM) was held at the National Institute of Standards and Technology (NIST)...

10 kV DC Resistive Divider Calibration

January 1, 1995

Author(s)

R. S. Turgel

Time and Frequency: Bibliography of NIST Publications

January 1, 1995

Author(s)

G E. Bennett, Donald Sullivan

Motion-Model-Based Boundary Extraction

January 1, 1995

Author(s)

H Liu, Tsai H. Hong, Martin Herman, Rama Chellappa

Motion boundary extraction and optical flow computation are two subproblems of the motion recovery problem that cannot be solved independently of each other...

An Image-Based Texture-Independent Visual Motion Cue for Autonomous Navigation

January 1, 1995

Author(s)

S R. Kundur, Daniel Raviv

Vision, Unmanned Systems, Robotics & Intelligent Systems, Mobility

Apparel Manufacturing Glossary for Application Protocol Development

January 1, 1995

Author(s)

Michael Read

A glossary of terms used in apparel manufacturing, specifically those used in the pattern-making process, are listed verbatim from six primary sources. These...

Roadmap for the Computer Integrated Manufacturing Application Framework

January 1, 1995

Author(s)

Selden Stewart, James A. St Pierre

This is the final report for the first year of a joint project between the National Institute of Standards and Technology (NIST) and SEMATECH. It presents a...

Algorithm Testing and Evaluation Program for Coordinate Measuring Systems: Testing Methods

January 1, 1995

Author(s)

Cathleen Diaz

The Algorithm Testing and Evaluation Program for Coordinated Measuring Systems (ATEP-CMS) is a NIST Special Test Service offered through the Office of...

The MITT Electronic Library: Implementation Description

January 1, 1995

Author(s)

Michelle P. Steves, Peter F. Hart

The National Institute of Standards and Technology is in the process of establishing an electronic library which will serve the manufacturing community. The...

ISO TC 184/SC4 Reference Manual

January 1, 1995

Author(s)

Joan Wellington, Bradford Smith

This reference manual contains background information on the International Organization for Standardization (ISO) and its Technical Committee 184. It gives a...

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