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NIST Interagency/Internal Report (NISTIR)

Common Biometric Exchange File Format (CBEFF), Augmented

Author(s)
Fernando L. Podio, J S. Dunn, L Reinert, C J. Tilton, L O'Gorman, P Collier, Mark Jerde, B Wirtz
This report is an augmentation of the original standard, which was published as NISTIR 6529 (January 2001). Common Biometric Exchange File Format (CBEFF)

Fingerprint Image Quality

Author(s)
Elham Tabassi, Charles Wilson, Craig I. Watson
In this report, we propose a new definition of quality of fingerprint impressions and present detailed algorithms to measure image quality for fingerprints. We

2nd Annual PKI Research Workshop Proceedings

Author(s)
Carl M. Ellison, William Polk, Nelson Hastings, Sean W. Smith
NIST hosted the second annual Public Key Infrastructure (PKI) Research Workshop on April 28-29, 2003. The two-day event brought together PKI experts from

A Welding Data Dictionary

Author(s)
William G. Rippey
This data dictionary specifies data elements that are used to describe the design, fabrication and inspection of weldments. It comprises welding information

Feature-Based Inspection and Control System

Author(s)
Thomas Kramer, John A. Horst, Hui-Min Huang, Elena R. Messina, Frederick M. Proctor, Harry A. Scott
This report describes an architecture and software system for automatically performing process planning and control code generation for cutting and inspecting

Automated Composition of Conversion Software

Author(s)
David W. Flater
Given a library of converters with known behaviors, an integration engine must determine which are useful in a given scenario and produce a plan for how they

Workflow Automation in a B2B Web-Portal Testbed

Author(s)
Marjane Mabrouk, Frederic J. de Vaulx, Tom Rhodes
The work described in this report, focused on specifying and managing different steps of a Business-to-Business (B2B) workflow by developing and integrating a

Shape-Sensitive Linewidth Measurements of Resist Structures

Author(s)
John S. Villarrubia, Andras Vladar, Michael T. Postek
Widths of developed 193 nm resist lines were measured by two methods and compared. One method was a new model-based library method. In this method the scanning

Time and Frequency Bulletin

Author(s)
Eyvon Petty
The Time and Frequency Bulletin provides information on performance of time scales and a variety of broadcasts (and related information) to users of the NIST
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