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NIST Interagency/Internal Report (NISTIR)

Effect of Positive Pressure Ventilation on a Room Fire

March 1, 2005

Author(s)

Stephen Kerber, William D. Walton

Fire departments use ventilation blowers or fans to pressurize a structure prior to suppressing a fire. This pressurization or positive pressure ventilation...

Software Write Block, Testing Support Tools Validation Part B Test and Code Review Report

March 1, 2005

Author(s)

Paul E. Black

This NIST Internal Report consists of two parts. Part A covers the planning, design, and specification of testing and reviewing the Software write block (SWB)...

Slap Fingerprint Segmentation Evaluation 2004 Analysis Report

March 1, 2005

Author(s)

Brad Ulery, R. A. Hicklin, Craig I. Watson, Michael D. Indovina, Kayee Hanaoka

The Slap Fingerprint Segmentation Evaluation 2004 (Slap Seg04) was conducted to assess the accuracy of algorithms used to segment slap fingerprint images into...

Product Lifecycle Management Support: A Challenge in Supporting Product Design and Manufacturing in a Networked Economy

March 1, 2005

Author(s)

Eswaran Subrahmanian, Sudarsan Rachuri, Steven J. Fenves, Sebti Foufou, Ram D. Sriram

In this paper, we provide an overview of the changing design and manufacturing landscape in the 21st century that has come about because of the arrival of IT...

2005 Programs of the Manufacturing Engineering Laboratory

March 1, 2005

Author(s)

Lisa J. Fronczek, Bessmarie A. Young

The National Institute of Standards and Technology?s Manufacturing Engineering Laboratory (MEL)strengthens the U.S. economy and improves the quality of life by...

Weighs & Measures Division Quality Manual for Proficiency Testing and Interlaboratory Comparisons

February 28, 2005

Author(s)

Georgia L. Harris, J C. Gust

This document has been developed for the NIST Technology Services, Weights and Measures Division (WMD) in order to establish and implement a quality system for...

NFIQ Compliance Test

February 14, 2005

Author(s)

Elham Tabassi

In August 2004 NIST published a novel measure of fingerprint image quality, which can be used to estimate fingerprint match performance. The definition and...

Chemical Science and Technology Laboratory: Annual Report FY2004

February 9, 2005

Author(s)

W Koch, Eric B. Steel, Ellyn S. Beary

This report summarizes the research and services provided by the Chemical Science and Technology Laboratory of the National Institute of Standards and...

Redesign of the 112.5 kN Dead Weight Machine Snubber System

February 1, 2005

Author(s)

Kevin L. Chesnutwood

This paper forcuses on the redesign of the snubber system that is used in the 112.5kN dead weight machine located at the National Institute of Standards and...

Conformance Testing of the Government Smart Card

February 1, 2005

Author(s)

Elizabeth N. Fong

A conformance Test suite helps to ensure consistency between a specification and the behavior of a product. This paper presents the conformance testing...

NIST Biometric Evaluations and Developments

February 1, 2005

Author(s)

Michael D. Garris, Charles L. Wilson

This paper presents an R&D framework used by the National Institute of Standards and Technology (NIST) for biometric technology testing and evaluation. The...

Effect of Image Size and Compression on One-to-One Fingerprint Matching

February 1, 2005

Author(s)

Craig I. Watson, Charles L. Wilson

NIST has conducted testing of one-to-one fingerprint matching systems to evaluate the effect of image size and compression on the accuracy of the one-to-one...

Simulated Performance of Natural and Hybrid Ventilation Systems in an Office Building

February 1, 2005

Author(s)

Steven J. Emmerich, J Crum

A key finding of past research on natural ventilation is that the potential application of pure natural ventilation systems may be limited in the United States...

2004 Information Technology Laboratory (ITL) Technical Accomplishments

February 1, 2005

Author(s)

Elizabeth B. Lennon

Camera Calibration for a Manufacturing Inspection Workstation

January 31, 2005

Author(s)

Tsung-Ming Tsai

A CCD camera mounted on a manufacturing part inspection workstation is calibrated for measuring 3D part geometry. It is calibrated by using computer algorithms...

NIST Response to the 7th CORM Report: Pressing Problems and Projected National Needs in Optical Radiation Measurement

January 17, 2005

Author(s)

Albert C. Parr, Gerald T. Fraser, Yoshihiro Ohno

The Council for Optical Radiation Measurements (CORM) issues periodic reports relevant to the mission of the Optical Technology Division of the Physics...

Workshop to Define Information Needed by Emergency Responders During Building Emergencies

January 3, 2005

Author(s)

Walter W. Jones, William D. Davis, D D. Evans, David G. Holmberg, Steven T. Bushby, K A. Reed

On May 3, 2004, NIST sponsored a workshop to identify the information needs for emergency responders. The purpose of this workshop was to obtain guidance on the...

NIST Time and Frequency Bulletin

January 3, 2005

Author(s)

Eyvon Petty

The Time and Frequency Bulletin provides information on performance of time scales and a variety of bradcasts (and related information) to users fo the NIST...

NIST Response to the 7th CORM Report: Pressing Problems and Projected National Needs in Optical Radiation Measurements,"

January 1, 2005

Author(s)

Gerald T. Fraser, Yoshihiro Ohno, Albert C. Parr

Chemicals in Arctic Seabirds: I. Annotated Bibliography

January 1, 2005

Author(s)

Stacy S. Vander-Pol, Rebecca S. Pugh, Paul R. Becker

The purpose of the work resulting in this report was to compare literature values of contaminant concentrations in the 39 species of Arctic seabirds that live...

EEEL - Office of Law Enforcement Standards - Programs, Activities, and Accomplishments

January 1, 2005

Author(s)

Thomas J. Russell

The Office of Law Enforcement Standards (OLES) of the National Institute of Standards and Technology (NIST) helps law enforcement and criminal justice agencies...

Optoelectronics Division Programs, Activities, and Accomplishments

January 1, 2005

Author(s)

Kent B. Rochford

The NIST Optoelectronics Division provides measurement technology, standards, and traceability for the optoelectronics industry. This document describes the...

NIST/EEEL Electromagnetics Division: Programs, Activities, and Accomplishments

January 1, 2005

Author(s)

Ronald B. Goldfarb

The Electromagnetics Division is a critical national resource for a wide range of customers. U.S. industry is the primary customer both for the division's...

Semiconductor Electronics Division: Programs, Activities, and Accomplishments

January 1, 2005

Author(s)

Erik M. Secula

This document represents the fiscal year 2004 production of the programs comprising the Semiconductor Electronics Division. Program goals, customer needs...

CPM 2: A Revised Core Product Model for Representing Design Information

January 1, 2005

Author(s)

Steven J. Fenves, Sebti Foufou, Conrad Bock, Roger Bouillon, Ram D. Sriram

This report presents a revised version of the Core Product Model (CPM) initially reported in [1]. The objectives of the report are: (1) to document the changes...

Specification for the Extensible Configuration Checklist Description Format (XCCDF)

January 1, 2005

Author(s)

Neal Ziring, John Wack

This document specifies the data model and XML representation for the Extensible Configuration Checklist Description Format. An XCCDF document is a structured...

Precise theory of levels of hydrogen and deuterium: The two-photon radiative corrections

January 1, 2005

Author(s)

Ulrich D. Jentschura, Peter Mohr

Office of Microelectronics Programs - Programs, Activities, and Accomplishments

January 1, 2005

Author(s)

Stephen Knight, Joaquin (. Martinez, Michele L. Buckley

The microelectronics industry supplies vital components to the electronics industry and to the U.S. economy, enabling rapid improvements in productivity and in...

Shop Data Model and Interface Specification

January 1, 2005

Author(s)

Charles R. McLean, Yung-Tsun Lee, Guodong Shao, Frank H. Riddick

This paper presents an information model that provides neutral data interfaces for integrating machine shop software applications with simulation. The model is...

The Critical Value of NIST to the Worldwide Metrology Interoperability Effort

December 31, 2004

Author(s)

John A. Horst, R Waite

The uniqueness and importance of the role of NIST to the worldwide metrology interoperability effort is explained and defended. The highlights of...

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