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NIST Interagency/Internal Report (NISTIR)

NIST Biometric Evaluations and Developments

February 1, 2005

Author(s)

Michael D. Garris, Charles L. Wilson

This paper presents an R&D framework used by the National Institute of Standards and Technology (NIST) for biometric technology testing and evaluation. The

Conformance Testing of the Government Smart Card

February 1, 2005

Author(s)

Elizabeth N. Fong

A conformance Test suite helps to ensure consistency between a specification and the behavior of a product. This paper presents the conformance testing

Redesign of the 112.5 kN Dead Weight Machine Snubber System

February 1, 2005

Author(s)

Kevin L. Chesnutwood

This paper forcuses on the redesign of the snubber system that is used in the 112.5kN dead weight machine located at the National Institute of Standards and

Camera Calibration for a Manufacturing Inspection Workstation

January 31, 2005

Author(s)

Tsung-Ming Tsai

A CCD camera mounted on a manufacturing part inspection workstation is calibrated for measuring 3D part geometry. It is calibrated by using computer algorithms

NIST Response to the 7th CORM Report: Pressing Problems and Projected National Needs in Optical Radiation Measurement

January 17, 2005

Author(s)

Albert C. Parr, Gerald T. Fraser, Yoshihiro Ohno

The Council for Optical Radiation Measurements (CORM) issues periodic reports relevant to the mission of the Optical Technology Division of the Physics

NIST Time and Frequency Bulletin

January 3, 2005

Author(s)

Eyvon Petty

The Time and Frequency Bulletin provides information on performance of time scales and a variety of bradcasts (and related information) to users fo the NIST

Workshop to Define Information Needed by Emergency Responders During Building Emergencies

January 3, 2005

Author(s)

Walter W. Jones, William D. Davis, D D. Evans, David G. Holmberg, Steven T. Bushby, K A. Reed

On May 3, 2004, NIST sponsored a workshop to identify the information needs for emergency responders. The purpose of this workshop was to obtain guidance on the

NIST/EEEL Electromagnetics Division: Programs, Activities, and Accomplishments

January 1, 2005

Author(s)

Ronald B. Goldfarb

The Electromagnetics Division is a critical national resource for a wide range of customers. U.S. industry is the primary customer both for the division's

Optoelectronics Division Programs, Activities, and Accomplishments

January 1, 2005

Author(s)

Kent B. Rochford

The NIST Optoelectronics Division provides measurement technology, standards, and traceability for the optoelectronics industry. This document describes the

Semiconductor Electronics Division: Programs, Activities, and Accomplishments

January 1, 2005

Author(s)

Erik M. Secula

This document represents the fiscal year 2004 production of the programs comprising the Semiconductor Electronics Division. Program goals, customer needs

EEEL - Office of Law Enforcement Standards - Programs, Activities, and Accomplishments

January 1, 2005

Author(s)

Thomas J. Russell

The Office of Law Enforcement Standards (OLES) of the National Institute of Standards and Technology (NIST) helps law enforcement and criminal justice agencies

Chemicals in Arctic Seabirds: I. Annotated Bibliography

January 1, 2005

Author(s)

Stacy S. Vander-Pol, Rebecca S. Pugh, Paul R. Becker

The purpose of the work resulting in this report was to compare literature values of contaminant concentrations in the 39 species of Arctic seabirds that live

NIST Response to the 7th CORM Report: Pressing Problems and Projected National Needs in Optical Radiation Measurements,"

January 1, 2005

Author(s)

Gerald T. Fraser, Yoshihiro Ohno, Albert C. Parr

Office of Microelectronics Programs - Programs, Activities, and Accomplishments

January 1, 2005

Author(s)

Stephen Knight, Joaquin (. Martinez, Michele L. Buckley

The microelectronics industry supplies vital components to the electronics industry and to the U.S. economy, enabling rapid improvements in productivity and in

CPM 2: A Revised Core Product Model for Representing Design Information

January 1, 2005

Author(s)

Steven J. Fenves, Sebti Foufou, Conrad Bock, Roger Bouillon, Ram D. Sriram

This report presents a revised version of the Core Product Model (CPM) initially reported in [1]. The objectives of the report are: (1) to document the changes

Shop Data Model and Interface Specification

January 1, 2005

Author(s)

Charles R. McLean, Yung-Tsun Lee, Guodong Shao, Frank H. Riddick

This paper presents an information model that provides neutral data interfaces for integrating machine shop software applications with simulation. The model is

Precise theory of levels of hydrogen and deuterium: The two-photon radiative corrections

January 1, 2005

Author(s)

Ulrich D. Jentschura, Peter Mohr

Specification for the Extensible Configuration Checklist Description Format (XCCDF)

January 1, 2005

Author(s)

Neal Ziring, John Wack

This document specifies the data model and XML representation for the Extensible Configuration Checklist Description Format. An XCCDF document is a structured

Terrain Characterization for TRL-6 Evaluation of an Unmanned Ground Vehicle

December 31, 2004

Author(s)

Michael O. Shneier, Tsai H. Hong, Tommy Chang, Harry A. Scott, Steven Legowik, Geraldine S. Cheok, Charles Giauque

The Critical Value of NIST to the Worldwide Metrology Interoperability Effort

December 31, 2004

Author(s)

John A. Horst, R Waite

The uniqueness and importance of the role of NIST to the worldwide metrology interoperability effort is explained and defended. The highlights of

Submillimeter and THz Detection of Chemical-Warfare Agents in Air

December 31, 2004

Author(s)

Vyacheslav B. Podobedov, R J. Lavrich, T M. Korter, Gerald T. Fraser, David F. Plusquellic, A C. Samuels

Experimental measurements and theoretical calculations were performed to assess the potential for using continuous-wave submillimeter and THz (far-infrared)

Camera Calibration for a Manufacturing Inspectio Workstation

December 31, 2004

Author(s)

T M. Tsai

A CCD camera mounted on a manufacturing part inspection workstation is calibrated for measuring 3D part geometry. It is calibrated by using computer algorithms

Coordinated Motion Control for Industrial Boomlifts

December 31, 2004

Author(s)

Richard J. Norcross, Robert Bunch

This project coordinated the motions of the individual actuators on an industrial boomlift. The work was funded by the U.S. Navy ManTech Program to augment the

Semiconductor Factory and Equipment Clock Synchronization for e-Manufacturing

December 15, 2004

Author(s)

Ya-Shian Li-Baboud, Brad Van Eck

This study describes the potential methods, challenges, and recommendations for addressing factory and equipment clock synchronization and time stamping. The

Ceramics Division FY 2004 Programs and Accomplishments

December 8, 2004

Author(s)

Debra L. Kaiser

A description of the technical activities and highlights of the Ceramics Division organized by projects within the MSEL programs.

Effect of Refrigerant Oil Additive on R134a and R123 Boiling Heat Transfer Performance and Related Issues for GSA.

December 1, 2004

Author(s)

Mark A. Kedzierski

Limits to the Effectiveness of Metal-Containing Fire Suppressants

December 1, 2004

Author(s)

Gregory T. Linteris

This report reviews the literature on metal inhibition of flames and identifies metal species with potential as fire suppressant additives. To provide a basis

NIST 3 Megawatt Quantitative Heat Release Rate Facility: Description and Procedures.

December 1, 2004

Author(s)

Rodney A. Bryant, Thomas J. Ohlemiller, Erik L. Johnsson, Anthony P. Hamins, B S. Grove, W F. Guthrie, Alexander Maranghides, George W. Mulholland

Analysis of Ventilation Data from the U.S. Environmental Protection Agency Building Assessment Survey and Evaluation (BASE) Study. (NIST IR 7145) [SUPERSEDED BY NIST IR 7145-R, Published 3/10/2009]

December 1, 2004

Author(s)

Andrew K. Persily, J Gorfain

The U.S. Environmental Protection Agency (EPA) Building Assessment Survey and Evaluation (BASE) study included a range of measurements in 100 randomly selected

Ultrasonic Extraction/Anodic Stripping Voltammetry for Determining Lead in Dust: A Laboratory Evaluation.

December 1, 2004

Author(s)

Walter J. Rossiter Jr, B Toman, M E. McKnight, I Emenanjo, M B. Anaraki

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