News and Updates

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NIST Industrial Wireless Systems Team Participates in ASTM F45 Committee Panel Discussion

December 1, 2023

NIST’s Rick Candell and Mohamed Hany were invited to participate in the ASTM F45.04 Robotics, Automation, and Autonomous Systems panel discussion on

NIST Researcher Presents on Use of SimPROCESD Software to Model Manufacturing Production and Maintenance

December 1, 2023

At the 2023 INFORMS Annual Meeting, NIST researcher Mehdi Dadfarnia presented research findings based on use of NIST-developed SimPROCESD software, which can

NIST Researchers Propose Expanded Modeling of Physical Interaction in Complex Systems

September 1, 2023

In a presentation to the standards development organization Object Management Group (OMG), NIST’s Charlie Manion and Conrad Bock proposed a way to expand the

NIST’s Industrial Wireless Systems Lab Adds Capability to Support IEEE Standards Effort

September 1, 2023

NIST’s Industrial Wireless Systems Lab is developing research testbed capabilities to support the IEEE standardization effort, P3388, the Standard for Radio

University Students Aid Smart Connected Systems Research in NIST’s SURF Program

August 1, 2023

Annually, NIST selects students for Summer Undergraduate Research Fellowships (SURF) to work in areas that support its mission. NIST seeks to inspire students

NIST Conducts Workshop on Enhancing Industrial Wireless Systems Performance

August 1, 2023

In June 2023, NIST’s Industrial Wireless System Team, as part of the NIST-led Industrial Wireless Technical Interest Group, held an online workshop on

NIST, Intel Researchers Win Best Paper at IEEE’s Factory Communications Systems Conference

May 1, 2023

NIST and Intel researchers were awarded best paper at the 19 th IEEE International Conference on Factory Communications Systems (WFCS 2023), in April 2023. The

NIST Scientists Develop Novel CT Scan Device for Integrated Circuits

April 14, 2023

Researchers at the National Institute of Standards and Technology (NIST) and their colleagues have developed a novel tabletop device that takes three

NIST Leader Assesses State of Standardized Product Manufacturing Information at Workshop

March 1, 2023

In February 2023, NIST’s Allison Barnard Feeney addressed several standards for capturing product manufacturing information in a presentation to the Secure Data

Reliable Flow for Chip Makers

December 13, 2022

Researchers at the National Institute of Standards and Technology (NIST) have begun an ambitious project to attack a vexing problem in the semiconductor

Are Condition Monitoring Systems Worth It? NIST Researchers Offer Way to Evaluate

December 1, 2022

Industries may use "condition monitoring systems" (CMS) to monitor machines and enterprises – like production lines – for detrimental or unexpected changes in

On the Road to Tiny Transistors, How Flat is Flat?

June 21, 2022

Transistors are the building blocks of modern electronics, used in everything from televisions to laptops. As transistors have gotten smaller and more compact

Protecting control systems against cyberattacks

NIST Releases Cybersecurity Guide for Manufacturing Control Systems

March 1, 2022

The IBM X-Force Threat Intelligence Index 2022 stated “For the first time in five years, manufacturing outpaced finance and insurance in the number of

Strobe Light for 5G: NIST Imaging System Spotlights the Tiny Mechanical Hearts at the Core of Every Cellphone

February 4, 2022

Inside every cellphone lies a tiny mechanical heart, beating several billion times a second. These micromechanical resonators play an essential role in

NIST Researchers Resurrect and Improve a Technique for Detecting Transistor Defects

February 3, 2022

Researchers at the National Institute of Standards and Technology (NIST) have revived and improved a once-reliable technique to identify and count defects in

NIST-led IEEE Working Group Pursues Radio Channel Standard for Wireless

December 1, 2021

On November 16, 2021, IEEE initiated the IEEE P1451.p working group, now identified as IEEE P3388, chaired by NIST's Rick Candell and assisted by NIST's Kang

NIST Helps OMG Update a Simulations Standard, Improving System Engineering

November 29, 2021

Disclaimer: Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST. The

NEW RELEASE: Guide to Sustainable Investment Analysis

March 24, 2021

NIST’s Applied Economic Office released a “ Guide for Environmentally Sustainable Investment Analysis” based on ASTM E3200. This guide presents techniques for

A Lab-to-Market Tale: Icemaker Invention

April 7, 2020

Dr. David Yashar was always interested in finding ways to use practical application of science to improve real systems, so he studied mechanical engineering at

Opposite sides of a quartz crystal resonator

Universe in the Balance

February 12, 2020

Researchers at the National Institute of Standards and Technology (NIST) have found a way to link measurements made by a device integral to microchip

NIST Research Sparks New Insights on Laser Welding

April 30, 2019

On its surface, the work is deceptively simple: Shoot a high-power laser beam onto a piece of metal for a fraction of a second and see what happens. But

NIST: Blockchain Provides Security, Traceability for Smart Manufacturing

February 11, 2019

Engineers at the National Institute of Standards and Technology (NIST) needed a way to secure smart manufacturing systems using the digital thread, so they

A New Way to Measure Nearly Nothing

October 19, 2018

Many semiconductor fabricators and research labs are under increasing pressure from, of all things, vacuum. These facilities need to remove greater amounts of

Introducing the ‘Smart Mirror’

September 17, 2018

Lasers play roles in many manufacturing processes, from welding car parts to crafting engine components with 3D printers.* To control these tasks, manufacturers

Helping the Microchip Industry Go (Very Low) with the Flow

August 22, 2018

A new study by scientists at the National Institute of Standards and Technology (NIST) has uncovered a source of error in an industry-standard calibration

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