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News and Updates

Displaying 451 - 475 of 760

NIST Gets New Angle on X-Ray Measurements

Criminal justice, cosmology and computer manufacturing may not look to have much in common, but these and many other disparate fields all depend on sensitive

New Portable Vacuum Standard

A novel Portable Vacuum Standard (PVS) has been added to the roster of NIST's Standard Reference Instruments (SRI). It is now available for purchase as part of

Thin, Strong Bond for Vacuum Seal

An ultra-stable, ultra-thin bonding technology has been adapted by researchers in PML's Semiconductor and Dimensional Metrology Division for use as a super
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