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Associate Director for Laboratory Programs

News and Updates

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Hacking the SEM: Crystal Phase Detection for Nanoscale Samples

January 24, 2012

Custom modifications of equipment are an honored tradition of the research lab. In a recent paper, two materials scientists at the National Institute of

Cool Nano Loudspeakers Could Make for Better MRIs, Quantum Computers

January 24, 2012

A team of physicists from the Joint Quantum Institute (JQI), the Neils Bohr Institute in Copenhagen, Denmark, and Harvard University has developed a theory

International Community Gathers at NIST in March to Discuss Biometric Performance and Testing

January 24, 2012

The International Biometric Performance Conference 2012, to be held March 5-9 at the National Institute of Standards and Technology (NIST), will bring together

Updated Guidelines to Help Ensure Electrical Devices are Smart Grid Ready

January 24, 2012

Taking a step closer to ensuring that new electrical devices will be ready to plug into the nation's next-generation power grid, the National Institute of

CNST Collaboration Produces Ultra-Short Light Pulses Using On-Chip Microresonator

January 18, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Purdue University have designed and fabricated an on-chip microresonator that converts

CNST Collaboration Models Ionic Conductivity in Doped Ceria for use as a Fuel Cell Electrolyte

January 11, 2012

Optimizing the conductivity of ceria based oxides, or doped ceria, is crucial to their use as electrolytes in future solid oxide fuel cells. Researchers from

Stretching Exercises: Using Digital Images to Understand Bridge Failures

January 10, 2012

With a random-looking spatter of paint specks, a pair of cameras and a whole lot of computer processing, engineer Mark Iadicola of the National Institute of

NIST Technologies Contribute to Top Science Stories of 2011

January 10, 2012

The top science stories of 2011, as selected by several science magazines, include two experiments and a famous computer, that relied on technology from the

Photomicrograph showing human lung cells infected with cytomegalovirus.

NIST Standard Available for Better Diagnosis, Treatment of Cytomegalovirus

January 10, 2012

A new clinical Standard Reference Material (SRM) from the National Institute of Standards and Technology (NIST) will help health care professionals more

Text Retrieval Conference 2012 Seeks Information Retrieval Experts for Data Digging

January 10, 2012

The National Institute of Standards and Technology (NIST) is conducting the 21st annual Text Retrieval Conference (TREC), the premier experimental effort in the

NIST Releases Two New SRMs for Monitoring Human Exposure to Environmental Toxins

January 10, 2012

The National Institute of Standards and Technology (NIST), in collaboration with the Centers for Disease Control and Prevention (CDC), has developed two new

NIST software simulates the tip of an atomic force microscope moving left across a stack of four sheets of graphene.

Slippery When Stacked: NIST Theorists Quantify the Friction of Graphene

January 10, 2012

Similar to the way pavement, softened by a hot sun, will slow down a car, graphene—a one-atom-thick sheet of carbon with wondrous properties—slows down an

CNST Researchers Measure and Model Inhomogeneous Energy Landscapes in Graphene

January 4, 2012

If graphene is to live up to its promise as a revolutionary component of future electronics, the interactions between graphene and the surrounding materials in

CNST Collaboration Resolves Century-Long Debate Over How to Describe Electromagnetic Momentum Density in Matter

December 28, 2011

Researchers from the NIST Center for Nanoscale Science and Technology and the University of British Columbia have shown that the interaction between a light

NIST Sensor Improvement Brings Analysis Method into Mainstream

December 20, 2011

An advance in sensor design by researchers at the National Institute of Standards and Technology (NIST) and the University of Waterloo's Institute of Quantum

Protecting Computers at Start-Up: New NIST Guidelines

December 20, 2011

A new draft computer security publication from the National Institute of Standards and Technology (NIST) provides guidance for vendors and security

Colorized micrograph of multi-walled carbon nanotubes

Prototype NIST Device Measures Absolute Optical Power in Fiber at Nanowatt Levels

December 20, 2011

Researchers at the National Institute of Standards and Technology (NIST) have demonstrated a prototype device capable of absolute measurements of optical power

Scanning electron microscope image of a typical sample of the NIST single-wall carbon nanotube soot standard reference material.

NIST Releases First Certified Reference Material for Single-Wall Carbon Nanotubes

December 20, 2011

The National Institute of Standards and Technology (NIST) has issued the world's first reference material for single-wall carbon nanotube soot. Distantly

CNST Collaboration Demonstrates Nanoscale Focused Ion Beam Employing Laser-Cooled Lithium Atoms

December 14, 2011

A team of researchers from the NIST Center for Nanoscale Science and Technology and FEI Company have adapted a commercial focused ion beam (FIB) column to use

NIST Special Publication Expands Government Authentication Options

December 13, 2011

A newly revised publication from the National Institute of Standards and Technology (NIST) expands the options for government agencies that need to verify the

UV Lithography: Taking Extreme Measures

December 9, 2011

Sometime soon, microchip fabricators will take the next major step in the relentless reduction of feature size, from the current minimum of 22 nm down to 10 nm

PML Researchers Create Tool for 'Circuit-Aware' Reliability Testing

December 9, 2011

A PML research team has devised a reliability data transformation methodology that could ease one of the semiconductor industry's most vexing problems

International Collaboration Reveals Magnetization Textures in NiPd Nanostructures

December 7, 2011

An international collaboration, including researchers from the NIST Center for Nanoscale Science and Technology, has used scanning electron microscopy with

New NIST Biometric Data Standard Adds DNA, Footmarks and Enhanced Fingerprint Descriptions

December 6, 2011

The National Institute of Standards and Technology (NIST) published a revised biometric standard in November, 2011, that vastly expands the type and amount of

Elusive Ultrafine Indoor Air Contaminants Yield to NIST Analysis

December 6, 2011

Researchers at the National Institute of Standards and Technology (NIST) spent 75 days on the job carrying out some very important homework—measurements in a

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