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2020 International Scanning Probe Microscopy (ISPM) + Scanning Probe Microscopy on Soft & Polymeric Materials (SPMonSPM)

ISPM 2020 Conference

NIST is closely monitoring guidance from Federal, State, and local health authorities on the outbreak of COVID-19. To protect the health and safety of speakers and attendees, NIST has decided to postpone the event. For more information on COVID-19, please visit coronavirus.gov.

The 2020 joint conference on International Scanning Probe Microscopy (ISPM) and Scanning Probe Microscopy on Soft and Polymeric Materials (SPMonSPM) aims to unite a broad cross-section of scanning probe microscopy (SPM) researchers from around the world. The conference represents a merger of the 22nd hosting of ISPM and the 5th hosting of SPM on SPM.  The conference will bring together users ranging from biology, polymer science, energy, computing and beyond, linked by a common interest in the role of SPM to elucidate new physical and chemical phenomena. Junior and senior researchers from industry, academia and government institutions will present their latest developments. The environment will foster new ideas and collaborations across multiple disciplines. The format will include distinguished plenary talks, invited talks, contributed talks, posters and an exhibit.

Plenary speakers: Ricardo Garcia, Sergei Kalinin and Simon Scheuring

Portraits of ISPM3 Plenary Speakers

Confirmed invited speakers and workshop lecturers (more to come):

Sonia Contera, Igor Sokolov, Ken Nakajima , Philippe Leclere, Callie Higgins, Takeshi Fukuma, Georg Fantner, Gabriel Gomilla, Roger Proksch, Bede Pittenger, Rama K Vasudevan, Loren Picco, David Haviland, Adam Foster, Markus Raschke, Shuai Zhang, Robert Wolkow, Hermann Gaub, Peter Hinterdorfer

Abstract submissions

The organizers welcome the submission of technical abstracts for oral or poster presentations at the 2020 i(SPM)3. Please use the attached template to prepare your 1 page abstracts: 

TEMPLATE 

Abstracts should be submitted by email using the below link. Please complete all fields indicated in the email link. 

Abstracts due on Jan 24th Mar 2nd

jason.killgore [at] nist.gov (subject: ISPM2020AbstractSubmission, body: Presenter%20First%20Name%3A%0ALast%20Name%3A%0AAffiliation%3A%0AContact%20email%20address%3A%0AAbstract%20title%3A%0APoster%20preferred%20yes%2Fno%3F%20(default%20is%20Oral%20preferred)%0AInterested%20in%20submitting%20a%20full%20article%20for%20a%20special%20issue%20of%20Ultramicroscopy%3F%20Yes%2Fno%3F) (SUBMIT BY EMAIL)

Submissions covering all forms of SPM techniques, instrumentation and application are welcome. Specific target areas include, but are not limited to:

  • SPM in Biology and Medicine 

  • SPM on Polymers 

  • Nanomechanics

  • Multi-frequency AFM 

  • Advances in Solid-Liquid Interface Imaging 

  • STM and UHV AFM

  • Ultra high resolution SPM

  • SPM in Extreme Environments

  • SPM for Quantum Materials

  • SPM for Energy Applications

  • Electromechanical Sensing 

  • Electrochemical Sensing (Force and Current Based)

  • SPM for Solar Materials

  • High Speed AFM

  • Correlative/Combined Imaging

  • Chemical Imaging

  • Machine learning and AI in SPM

If you have trouble launching the auto-populated email submission link above, please send an email to jason.killgore [at] nist.gov with Subject: ISPM2020AbstractSubmission

With the following fields complete:

Presenter First Name:

Last Name:

Affiliation:

Contact email address:

Abstract title:

Poster preferred yes/no? (default is Oral preferred)

Interested in submitting a full article for a special issue of Ultramicroscopy? Yes/no?

Created October 22, 2019, Updated March 24, 2020