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High Frequency Scanning Probe Microscopy Workshop

Radio Frequency Scanning Probe

Local, near-field probing is a powerful technique for studying electromagnetic material properties with sub-wavelength resolution. In turn, near-field scanning probe microscopy impacts fundamental research and applications in a wide variety of fields, including quantum materials, low-dimensional systems, superconductivity, biological systems, and nanoscale fabrication. To date, the most prominent near-field probing results have been in the visible and near- to mid-infrared regimes. Near-field probing at longer wavelengths – including the microwave, mm-wave/THz, and far-infrared regimes – is less mature, but presents broad, emerging research opportunities in quantitative electromagnetic material and device characterization. This workshop will bring together researchers in microwave, THz, and far-infrared scanning probe microscopy to share breakthroughs in research, exchange ideas about this emerging field, and encourage new collaborations.

Join researchers from academia, industry, and government laboratories for this two-day workshop on all aspects of near-field, high frequency scanning probe microscopy from microwaves through THz and to the far-infrared.

08:00 to 17:30 MT on December 12
08:00 to 12:00 MT on December 13

Final Schedule, High Frequency Scanning Probe Microscopy Workshop

NIST Boulder, December 12-13

Day

Session

Start Time

End Time

Speaker

Title

December 12

Breakfast Available

8:00

9:00

Breakfast

 
   

8:30

8:40

Mitch Wallis / Kristan Corwin / Sam Berweger, NIST

Opening Remarks / Announcements

 

Session One

8:40

9:20

Keji Lai, U. of Texas, Austin

Probing Spatial and Temporal Dynamics of Photo-generated Carriers by Microwave Microscopy

   

9:20

9:45

David Scrymgeour, Sandia

Scanning microwave impedance microscopy of buried dopant nanostructures in silicon

   

9:45

10:10

Joanna Atkin, U. of North Carolina

Near-field optical spectroscopy for the study of electronic properties in semiconducting nanostructures

 

Break

10:10

10:40

Break

 
 

Session Two

10:40

11:20

Yasuo Cho, Tohoku U.

High resolution characterizations of fine structure of electric devices and materials using scanning nonlinear dielectric microscopy

   

11:20

11:45

Hans Bechtel, LBNL

Broadband Synchrotron Infrared Nanospectroscopy

   

11:45

12:10

Holger Thierschmann, TU Delft

Towards a scanning THz impedance microscope

 

Lunch

12:10

13:00

Lunch

 
 

Session Three

13:00

13:40

Alex McLeod, Columbia

Developments and applications in low-temperature nano-imaging

   

13:40

14:05

Yong-Tao Cui, UC-Riverside

Imaging 2D Topological Systems by Microwave Impedance Microscopy

   

14:05

14:30

Olaf Haenssler, Oldenburg

Multimodal Sensing and Imaging Technology by Integrated Scanning Electron, Force, and Nearfield Microwave Microscopy

 

Break/Posters

14:30

15:15

Break/Posters

 
 

Session Four

15:15

15:40

Ravi Chintala,

PrimeNano

Advances in scanning microwave impedance microscopy

   

15:40

16:05

Tyler Cocker, Michigan State

Ultrafast terahertz microscopy: from near fields to single atoms

   

16:05

17:30

Posters

 

December 13

Breakfast Available

8:00

9:00

Breakfast

 
   

8:30

8:35

 

Opening Remarks / Announcements

 

Session Five

8:35

9:15

Markus Raschke, U. of Colorado, Boulder

Ultrafast and nonlinear nano-optical imaging and control of quantum dynamics in time and space

   

9:15

9:40

Marco Farina, U. Politecnica delle Marche

On the Inverted Near-Field Scanning Microwave Microscope

   

9:40

10:05

Fabian Mooshammer, Regensburg

Ultrafast multi-THz nanoscopy of van der Waals materials

 

Break

10:05

10:35

Break

 
 

Session Six

10:35

11:00

Bill Wilson, Harvard

Scan-probe Spectroscopy/Microscopy of Quantum Materials: Spatially Resolved Quasiparticle Dynamics probed at the Nanoscale

   

11:00

11:25

Alex Tselev, U. of Aveiro

Near-field microwave microscopy in application to in situ subsurface imaging and characterization

   

11:25

11:50

Johannes Hoffmann, METAS

Standards and Coaxial Tips for Scanning Microwave Microscopy

   

11:50

12:00

Steve Anlage, U. of Maryland

Closing Remarks

 

Lunch

12:00

 

Lunch

 

 

Presented Posters

“Infrared Optical Nano-Crystallography and Chemical Nano-Imaging,” by Hans Bechtel, Connor Bischak, Sven Donges, Naomi Ginsburg, Thomas Gray, Omar Khalib, Simon Labouesse, Liant-Chun Lin, Mike Martin, Andrew Minor, Eric Muller, Jun Nishida, Ben Pollard, Markus Raschke, and Steven Zeltman

“Ultrafast nano-imaging and nonlinear nano-optics,” by Tao Jiang, Yijian Cai, Vasily Kravtsov, Fabian Menges, and Markus Raschke

“High Frequency Near-Field Magnetic Microscope,” by Bakrom Oripov and Steven Anlage

“In liquid infrared scattering scanning near-field optical microscopy for chemical and biological nano-imaging,” by Brian O’Callahan, Kyoung-Duck Park, Irina Navikova, Tengyue Jian, Chun-Long Chen, Patrick Z. El-Khoury, Markus Raschke, and A. Scott Lea

“Quantitative Measurement and Traceability of Scanning Microwave Microscope (SMM) based on Atomic Force Microscopy (AFM),” by Masahiro Horibe

“Guideline for On-Wafer Microwave Characterization of 1D Materials,” by K. Daffe, Y. Coffiner, I.  Roch-Jeune, C. Boyaval, G. Dambrine, and K. Haddadi

“Laser Scanning Microscopy for Imaging gap symmetry of unconventional superconductors and collective modes of a SQUID array,” Seokjin Bae, Alexander P. Zhuravel, and Steven Anlage

“The inverted near-field scanning microwave microscope,” by Gianluca Fabi, C. H. Joseph, Eleonora Pavoni, Xin Jin, Xiaopeng Wang, Davide Mencarelli, Andrea di Donato, Antonio Morini, Yan Zhao, Richard Al Hadi, James C. M. Hwang, and Marco Farina

“Disentangling topographic effects from Near-field Scanning Microwave Microscopy Images,” by K. J. Coakley, S. Berweger, T. M. Wallis, and P. Kabos

Imaging free carriers in 2D materials using Microwave Near-Field Microscopy,” by Sam Berweger, T. Mitch Wallis, and Pavel Kabos

Best Western Plus Boulder Inn -

Rates from $119 

Arrival Date: Wednesday, December 11, 2019

Book Now >>>

or Group code: call 800-233-8469 and reference code " NIST Radio Frequency Workshop "

 

 

If you are not registered, you will not be allowed on site.  Registered attendees will receive security and campus instructions prior to the workshop.

NON U.S. CITIZENS PLEASE NOTE:  All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will results, at a minimum, in significant delays in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12.

* New Visitor Access Requirement: Effective July 21, 2014, under the REAL ID Act of 2005, agencies, including NIST, can only accept a state-issued driver’s license or identification card from states that are REAL ID compliant or have an extension.  See the Department of Homeland Security (DHS) site for the current compliance list.

NIST currently accepts other forms of federally issued identification in lieu of a state-issued driver’s license, such as a valid passport, passport card, DOD’s Common Access Card (CAC), Veterans ID, Federal Agency HSPD-12 IDs, Military Dependents ID, Transportation Workers Identification Credential (TWIC), and TSA Trusted Traveler ID.

Created July 31, 2019, Updated December 17, 2019