FIB SEM image data set of Caenorhabditis elegans exposed to 60 nm Au nanoparticles

DOI: 10.18434/M3C09F

Keana Scott^1,*, Monique Johnson¹, Bryant Nelson¹, Shannon Hanna¹, Christopher Sims¹, Antonio Montoro Bustos¹, Ru-ching Hsia²

1. National Institute of Standards and Technology, Gaithersburg, MD
2. University of Maryland, Baltimore, MD

*Corresponding author: Keana Scott, keana.scott [at] nist.gov (keana[dot]scott[at]nist[dot]gov)

This folder contains image data sets from 14 separate serial sectioning sessions. The entire data folder consists of 1379 8 bit tif images and is 47.3 GB in size. Serial sectioning was performed using FEI Helios 660 NanoLab focused ion beam scanning electron microscope (FIB SEM) and Auto Slice and View G3 software. The sample was a heavy metal stained and resin embedded Caenorhabditis elegans (C. elegans) that was exposed to 60 nm Au nanoparticles. Detailed descriptions of the worm preparation and resin block processing are described in Johnson, M.E. et al. (ACS Nano, 2016). Although the images were collected over 14 different sessions, they represent a contiguous section of a worm.