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Tools and Instruments

Keyword

Organizational Unit

X-ray Absorption Fine Structure (XAFS)

The XAFS station uses a tunable, monochromatic, and moderately high energy X-ray beam (4.5 keV to 23.5 keV) for X-ray absorption spectroscopy measurements. The

X-ray Backscatter Systems

X-ray backscatter systems are used for the screening of personnel for hidden weapons and other contraband. Unlike conventional radiographic x-ray systems

$Bruker D8 Defractometer, a general purpose X-ray diffraction system.$

X-Ray Diffractometer

The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of

X-ray Photoelectron Spectroscopy

The Material Measurement Science Division at NIST performs surface chemical analysis using X-ray Photoelectron Spectroscopy (XPS) with capabilities for routine

X-Ray Reflectometer

The NCNR x-ray diffractometer is configured to allow both θ/2θ diffraction and reflectometry. Typically Cu radiation is used with minimum resolution of Δλ=0

X-Ray Residual Stress

The diffractometer is part of the Residual Stress Program with the main purpose of measuring strains/stresses. Other possible applications are the measurement