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Material Measurement Laboratory / Materials Measurement Science Division

Synchrotron Science Group

Tools and Instruments

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View of the sample area in the X-ray Diffraction (XRD) end station on the Beamline for Material Measurement (BMM). 

Synchrotron X-ray Diffraction (XRD)

The X-ray diffraction (XRD) end station measures constructive interference of the x-ray wave with repeating atomic and interfacial structure in materials. At
Picture of the sample area of the NIST X-ray Adsorbtion Fine Structure instrument, with NIST scientist Bruce Ravel, located at the National Synchrotron Light Source.

X-ray Absorption Fine Structure (XAFS)

The XAFS station uses a tunable, monochromatic, and moderately high energy X-ray beam (4.5 keV to 23.5 keV) for X-ray absorption spectroscopy measurements. The
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