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Projects/Programs

Topic Area
Displaying 326 - 350 of 1616

Cyber-Physical Systems and Internet of Things Foundations

Ongoing
Objective - To provide a common technical and conceptual foundation for CPS and IoT that enables conceptualization, realization and assurance across all domains, including a comprehensive and traceable methodology for meeting all stakeholder concerns throughout any systems engineering process and

Cybersecurity for Smart Grid Systems

Completed
Objective: To develop the measurement science needed to advance the development and standardization of cybersecurity, including privacy, policies, measures, procedures, and resiliency, in the smart electric grid. What is the new technical idea? As a result of deployment of new smart grid

Cybersecurity for Smart Manufacturing Systems

Completed
Manufacturers are hesitant to adopt common security technologies, such as encryption and device authentication, due to concern for potential negative performance impacts in their systems. This is exacerbated by a threat environment that has changed dramatically with the appearance of advanced

DARPA Friend or Foe (FoF) -- Independent Verification and Validation (IV&V)

Ongoing
Vision: Validate new measurement platforms for identifying commensal (friend) and pathogenic (foe) microorganisms Goal: Provide well-characterized, microbial community reference materials of increasing complexity Approach: Start with well-characterized pure cultures and scale up to complex consortia

Data Analytics for Smart Manufacturing Systems

Ongoing
Objective: Develop standards, software tools, methodologies, and guidelines to enable small and medium enterprises to apply data analytics services to improve decision-making and performance in smart manufacturing systems. Technical Idea: Manufacturers need enhanced decision-support tools that would

Data Driven Decision Support for Additive Manufacturing

Completed
Objective To develop and deploy the metrics, models, and best practices for using product definition, advanced analytics, and machine learning methods in additive manufacturing design and process planning to reduce lead times and support first-part-correct goals. Technical Idea Future advancements

AI/ML for Data Extraction and Uncertainty Predictions

Ongoing
The Material Measurement Lab at NIST employs artificial intelligence for the prediction and discovery of materials characteristics. Our applications of artificial intelligence (AI) accelerate materials research as well as help the community learn about AI's capabilities and gain confidence in

Data Infrastructure for Biomanufacturing Process Control

Ongoing
Objective The objective of this project is to develop measurement science that includes ontology models, ontology expression (axiomatic) patterns, guidelines for qualifying those ontologies, and distributed ontology development software that will allow U.S. manufacturers to have better access to

Data Integration and Management for Additive Manufacturing

Completed
Objective Data plays the most critical role in linking AM lifecycle and value chain activities and streamlining the AM development process. While the AM data from a single build is essential for establishing part traceability, when methodically collected, the full processing history of thousands of

Data Management and Fusion for AM Industrialization

Ongoing
Objective To develop methods, models, software tools, open data and best practices for data integration, management, and fusion in additive manufacturing to accelerate AM Industrialization. Technical Idea Our technical idea is to enable an integrated, streamlined and effective AM development and

Data Models for Expression of Uncertainty in Materials Data

Ongoing
The two main parts of this work are definition of appropriate data structures for different types of uncertainty analyses, and implementation of these data structures into analysis and visualization software for demonstration, testing, and use. The different types of uncertainty analyses to be

Data Science

Ongoing
Current MIG Data Science project activities DARPA D3M. NIST is supporting the DARPA D3M (Data-Driven Discoveries of Models) program as part of the Test and Evaluation (Government) Team. The D3M Program aims to allow automated systems with subject matter experts to model and solve complex machine

Data Tools for Environmental Metrology

Ongoing
A recent addition to operations in the NIST Biorepository, we seek out places where NIST scientists get bogged down by the complexity of their data. Research at NIST can generated some of the most complex data in the world, at times requiring six months or more of processing to get to the data

Decontamination of Biological Threats in Water Supplies

The outcome of the project was to provide the EPA with a technical resource document that could be used to guide emergency responders and for longer-term microbial decontamination of building water systems. This project was done in collaboration with the Building and Fire Research Laboratory (BFRL)

Deducing Prior Material Deformation from Simple Mechanics

Ongoing
Process-structure-property linkages suggest an opportunity to deduce processing from behavior. Simple imaging experiments provide rich sources of data. Can we deduce prior deformation? Scheme: Thin film plasticity Deform to some reference strain Unload Deform to test strain, image Deduce

Deep Generative Modeling for Communication Systems Testing and Data Sharing

Completed
After initial investigations with simulated datasets, we plan to develop generative models using real datasets. Potential applications of this work include generation of waveforms for interference testing, characterization of closed-box communication systems, and signal obfuscation for data sharing

Deep Learning for MRI Reconstruction and Analysis

Ongoing
The project is proceeding in three directions. Creating a new MRI reference artifact designed to assess geometric distortion using NIST’s MRI scanner. The artifact will be small enough to fit within the scanner with sufficient clearance to allow for variation in positioning within the scanner.

Degradation of extreme-ultraviolet optics

Ongoing
The primary degradation process in EUVL tools and satellite instruments begins by the adsorption of water or carbonaceous molecules from the vacuum environment onto the optic surface. The optic is damaged if the molecule undergoes photon-stimulated decomposition before it can (reversibly) thermally

Density Functional Tight Binding Methods

Presently the study by quantum chemistry techniques of large (several thousands of atoms) molecular systems is limited by large computer time and space (memory, disk) requirements. The required time, memory, and disk space to solve the requisite equations typically increase exponentially with the

Department of Homeland Security Response Robot Performance Standards

Ongoing
The Intelligent Systems Division of the National Institute of Standards and Technology is conducting an ongoing project, sponsored by the Department of Homeland Security Science and Technology Directorate and the National Institute of Justice, to produce a comprehensive set of standard test methods

Design and Analysis of Key Comparisons

Ongoing
DESCRIPTION: With the recent signing of the Mutual Recognition Arrangement (MRA), National Metrology Institutes (NMI's) and Regional Metrology Organizations (RMO's) around the world have committed themselves to establishing the equivalence of their measurement standards. Currently, however, there is

Design Fires for Structures Project

Ongoing
Objective: By 2016 to develop (1) the measurement science to fully characterize, deliver, and measure repeatable structurally significant fires for use in large-scale structural fire experiments and (2) a performance-based design framework linking fire intensity measures with expected structural

Design Methods for Resilient Community Systems

Ongoing
Objective - To advance design and assessment methods for buildings and infrastructure to improve their ability to support the social and economic functions they support and community resilience. What is the technical idea? Quantitative approaches to identify and evaluate the performance of the built

Designing Advanced Scanning Probe Microscopy Instruments

Ongoing
SPM is a general acronym for various probe instruments. The "P" in SPM stands for various types of probe measurements, such as capacitance (C), force (F), tunneling (T), etc. The scanning tunneling microscope (STM), including custom designs at the CNST, uses the quantum mechanical principle of